Astrometry for Astrophysics | Cambridge University Press | Datenbank |
van Altena

Astrometry for Astrophysics

Methods, Models, and Applications

Cambridge University Press

The field of astrometry, the precise measurement of the positions, distances and motions of astronomical objects, has been revolutionized in recent years. As we enter the high-precision era, it will play an increasingly important role in all areas of astronomy, astrophysics and cosmology. This edited text starts by looking at the opportunities and challenges facing astrometry in the twenty-first century, from space and ground. The new formalisms of relativity required to take advantage of micro-arcsecond astrometry are then discussed, before the reader is guided through the basic methods required to transform our observations from detected photons to the celestial sphere. The final section of the text shows how a variety of astronomical problems can be solved using astrometric methods. Bringing together work from a broad range of experts in the field, this is the most complete textbook on observational astrometry and is ideal for graduate students and researchers alike.
van Altena Astrometry for Astrophysics jetzt bestellen!


Weitere Infos & Material

Part I. Astrometry in the Twenty-First Century: 1. Opportunities and challenges for astrometry in the twenty-first century M. Perryman; 2. Astrometric satellites L. Lindegren; 3. Ground-based opportunities for astrometry N. Zacharias; Part II. Relativistic Foundations of Astrometry and Celestial Mechanics: 4. Vectors in astrometry, an introduction L. Lindegren; 5. Relativistic principles of astrometry and celestial mechanics S. Klioner; 6. Celestial mechanics of the N-body problem S. Klioner; 7. Celestial coordinate systems and positions N. Capitaine and M. Stavinschi; 8. Fundamental algorithms for celestial coordinates and positions P. Wallace; Part III. Observing through the Atmosphere: 9. The Earth's atmosphere: refraction, turbulence, delays and limitations to astrometic precision W. van Altena and E. Fomalont; 10. Astrometry with ground-based diffraction-limited imaging A. Ghez; 11. Optical interferometry A. Glindermann; 12. Radio interferometry E. Fomalont; Part VI. From Detected Photons to the Celestial Sphere: 13. Geometrical optics and astrometry D. Schroeder; 14. CCD imaging detectors S. Howell; 15. Using CCDs in the time-delayed integration mode D. Rabinowitz; 16. Statistical astronomy A. Brown; 17. Analyzing poorly-sampled images: HST imaging astrometry J. Anderson; 18. Image deconvolution J. Nuñez; 19. From measures to celestial coordinates Z. H. Tang and W. van Altena; 20. Astrometric catalogs: concepts, history and necessity C. López; 21. Trigonometric parallaxes F. Benedict and B. McArthur; Part V. Applications of Astrometry to Topics in Astrophysics: 22. Galactic structure astrometry R. Méndez; 23. Binary and multiple stars E. Horch; 24. Binaries: HST, Hipparcos and Gaia D. Pourbaix; 25. Star clusters I. Platais; 26. Solar System astrometry F. Mignard; 27. Extrasolar planets A. Sozzetti; 28. Astrometric measurement and cosmology R. Easther; Appendices; Index.

van Altena, William F.
William van Altena is Professor Emeritus in the Astronomy Department, Yale University, and has taught undergraduate and graduate courses in introductory astronomy, astronomical observing and astrometry for over 40 years. He served as Director of the Yerkes Observatory, Chair of the Yale Astronomy Department and was Team Leader for the Hubble Space Telescope's Astrometry Instrument Definition Team and a member of the HST Astrometry Science Team. His current research involves studies of the kinematical structure of the Milky Way in the Southern Hemisphere, binary stars and the use of high technology cameras to study galaxy remnants that are merging with the Milky Way.

Ihre Fragen, Wünsche oder Anmerkungen
Ihre E-Mail-Adresse*
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.