Buch, Englisch, 484 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 760 g
Buch, Englisch, 484 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 760 g
ISBN: 978-0-12-394298-2
Verlag: William Andrew Publishing
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Zielgruppe
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Fachgebiete
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
- Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
- Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
Weitere Infos & Material
- Measurement Techniques and Practical Issues
Jamal Deen
- Transmission lines and passive components
Guennadi A. Kouzaev
- Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping
Mohamed Bakr
- Field-effect types of transistors
Benjamin Iniguez
- RF MEMS Switches and Switch Matrices
Mojgan Daneshmand
- Substrate-Integrated Antennas on Silicon
Natalia K. Nikolova