Sonstiges, Englisch, 284 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
Sonstiges, Englisch, 284 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
ISBN: 978-3-0357-0903-2
Verlag: Trans Tech Publications
With the continuing evolution of fabrication techniques and new structures for semiconducting materials, the list of new defect phenomena has also increased apace. The present book discusses point defects, defect-assisted diffusion, metal impurity additions, metastable defects, magnetic hyperfine interaction of deep donors in compound semiconductors, and oxygen and hydrogen impurity defects.
Autoren/Hrsg.
Weitere Infos & Material
Intrinsic Point Defects and Grown-in Defects in SiliconPoint Defect Assisted Diffusion in SemiconductorsDiffusion and Electrical Properties of 3d Transition-Metal Impurities in SiliconMetastable Defects in Compound SemiconductorsElectronic Structure and Hyperfine Structure of Deep Donors in Si and in Some Compound SemiconductorsRole of Oxygen in Metal Silicide Formation and PropertiesThe Effects of Implanted Arsenic on Ti-Silicide FormationThe Interaction of Hydrogen with Deep Level Defects in SiliconRole of Metal Impurity 'Bi' in Amorphous Chalcogenide Semiconductors




