Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers

Erscheinungsjahr 2015
ISBN: 978-0-12-802252-8
Verlag: Elsevier Inc

Buch, Englisch, 224 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 494 g

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
• Naturwissenschaften Physik Elektromagnetismus Elektrizität, Elektrodynamik

Inhaltsverzeichnis

- Energy Analysis of Charged Particle FlowsVictor S. Gurov, Arman O. Saulebekov and Andrey A. Trubitsyn
- Analytical Design MethodsVictor S. Gurov, Arman O. Saulebekov and Andrey A. Trubitsyn
- Approximate-Analytical Method of Calculating the Charged Particle Trajectories in Electrostatic FieldsVictor S. Gurov, Arman O. Saulebekov and Andrey A. Trubitsyn
- Numerical Methods in the Design of Energy AnalyzersVictor S. Gurov, Arman O. Saulebekov and Andrey A. Trubitsyn

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.