Buch, Englisch, 358 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 575 g
Implications to High Level Design and Validation
Buch, Englisch, 358 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 575 g
ISBN: 978-1-4419-5466-4
Verlag: Springer US
The questions that confront computer engineers regarding the current status of nanocomputing material and the reliability of systems built from such miniscule devices, are difficult to articulate and answer. We have found a lack of resources in the confines of a single volume that at least partially attempts to answer these questions.
We believe that this volume contains a large amount of research material as well as new ideas that will be very useful for some one starting research in the arena of nanocomputing, not at the device level, but the problems one would face at system level design and validation when nanoscopic physicality will be present at the device level.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
- Mathematik | Informatik EDV | Informatik Technische Informatik Quantencomputer, DNA-Computing
- Mathematik | Informatik EDV | Informatik Angewandte Informatik Computeranwendungen in Wissenschaft & Technologie
Weitere Infos & Material
Nanometer Scale Technologies: Device Considerations.- Nanocomputing in the Presence of Defects and Faults: A Survey.- Defect Tolerance at the End of the Roadmap.- Obtaining Quadrillion-Transistor Logic Systems Despite Imperfect Manufacture, Hardware Failure, and Incomplete System Specification.- A Probabilistic-Based Design for Nanoscale Computation.- Tools and Techniques for Evaluating Reliability Trade-Offs for Nano-Architectures.- Law of Large Numbers System Design.- Challenges in Reliable Quantum Computing.- Origins and Motivations for Design Rules in QCA.- Partitioning and Placement for Buildable QCA Circuits.- Verification of Large Scale Nano Systems with Unreliable Nano Devices.