Scanning Tunneling Microscopy and Its Application

2. rev. Auflage 2000
ISBN: 978-3-540-65715-6
Verlag: Springer

Buch, Englisch, Band 32, 370 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 1600 g

Reihe: Springer Series in Surface Sciences

This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe techniques and the instrumentation and methods, the book provides detailed accounts of STM applications. It examines limitations of the present-day investigations and provides insight into further trends.
"I strongly recommend that Professor Bai's book be a part of any library that serves surface scientists, biochemists, biophysicists, material scientists, and students of any science or engineering field...There is no doubt that this is one of the better (most thoughtful) texts."
Journal of the American Chemical Society (Review of 1/e)

Zielgruppe

Research

Autoren/Hrsg.

Bai, Chunli

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Maschinenbau
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Naturwissenschaften Physik Elektromagnetismus Optik
• Technische Wissenschaften Technik Allgemein Technik: Allgemeines

Inhaltsverzeichnis

1. Introduction, 2. The Tunneling Effect, 3. Spectroscopy and Spectroscopic Imaging, 4. STM Instrumentation, 5. Other Related Scanning Probe Microscopes, 6. STM Studies of Clean Surfaces, 7. Surface Adsorbates and Surface Chemistry, 8. Biological Applications, 9. Surface Modification.