Scanning Probe Microscopy

The Lab on a Tip
1. Auflage. Softcover version of original hardcover Auflage 2004
ISBN: 978-3-642-07737-1
Verlag: Springer

Buch, Englisch, 210 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 347 g

Reihe: Advanced Texts in Physics

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Zielgruppe

Graduate

Autoren/Hrsg.

Bennewitz, Roland

Meyer, Ernst

Hug, Hans Josef

Fachgebiete

• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
• Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
• Naturwissenschaften Physik Quantenphysik Atom- und Molekülphysik
• Naturwissenschaften Physik Physik Allgemein Experimentalphysik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Technik Allgemein Nanotechnologie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
• Technische Wissenschaften Technik Allgemein Physik, Chemie für Ingenieure
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden

Inhaltsverzeichnis

1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.