Liebe Besucherinnen und Besucher,
aufgrund unseres Sommerfestes sind wir am 03. September 2026 bis 14 Uhr erreichbar. Am 04. September 2026 sind wir wieder wie gewohnt für Sie da. Vielen Dank für Ihr Verständnis.
Ihr Team von Sack Fachmedien
Buch, Englisch, 184 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 527 g
Reihe: Distinguished Dissertations
Buch, Englisch, 184 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 527 g
Reihe: Distinguished Dissertations
ISBN: 978-1-85233-468-0
Verlag: Springer
This book includes examples of interesting viable applications (eg. Forensic Science, History of Art, Virtual Reality, Architectural and indoor measurements), presented in a simple way, accompanied by pictures, diagrams and plenty of worked examples to help the reader understand and implement the algorithms.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
- Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz Computer Vision
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
- Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik
- Mathematik | Informatik EDV | Informatik Programmierung | Softwareentwicklung Grafikprogrammierung
- Mathematik | Informatik Mathematik Geometrie Elementare Geometrie: Allgemeines
Weitere Infos & Material
1. Introduction.- 1.1 Accurate measurements from images.- 1.2 Why use vision.- 1.3 Why is visual metrology hard.- 1.4 Applications and examples.- 1.5 Summary.- 2.Related work.- 2.1 Using one view.- 2.2 Using two views.- 2.3 Using three or more views.- 2.4 Partial calibration.- 2.5 Parallax-based approaches.- 2.6 Investigation of accuracy.- 2.7 Projective geometry and history of art.- Background geometry and notation.- 3.1 Camera models and perspective mappings.- 3.2 Radial distortion correction.- 3.3 Vanishing points and vanishing lines.- 3.4 Uncertainty analysis.- Metrology on planes.- 4.1 Estimating the homography.- 4.2 Uncertainty analysis.- 4.3 Application — a plane measuring device.- 4.4 Duality and homologies.- 5. Single-view metrology.- 5.1 Geometry.- 5.2 Algebraic representation.- 5.3 Uncertainty analysis.- 5.4 Three-dimensional metrology from a single view.- 5.5 Applications.- 5.6 Missing base point.- 6. Metrology from planar parallax.- 6.1 Background.- 6.2 Geometry and duality.- 6.3 Scene reconstruction.- 6.4 Uncertainty analysis.- Gallery of examples.- 7.1 Reconstruction from photographs.- 7.2 Reconstruction from paintings.- 7.3 Discussion.- 8. Conclusion.- 8.1 Summary.- 8.2 Discussion.- 8.3 Future work.- A. Metrology on planes, computing uncertainty in the homography.- B. Maximum likelihood estimation of end points for isotropic uncertainties.- C. Single-view metrology, variance of distance between planes.- C.1 Covariance of maximum likelihood estimation (MLE) end points.- D. Single-view metrology, variance of the affine parameter ?.- E. Metrology from planar parallax, derivations.- E.1 Computing the motion constraints.- E.2 Computing distances of points from planes directly in the images.- F. Metrology from planar parallax, variance of distances.- F.1Definitions.- References.




