Dietrich | Paint Analysis | Buch | 978-3-86630-912-8 | www.sack.de

Buch, Englisch, 143 Seiten, Format (B × H): 155 mm x 234 mm

Reihe: European Coatings Tech Files

Dietrich

Paint Analysis


1. Auflage 2009
ISBN: 978-3-86630-912-8
Verlag: Vincentz Network

Buch, Englisch, 143 Seiten, Format (B × H): 155 mm x 234 mm

Reihe: European Coatings Tech Files

ISBN: 978-3-86630-912-8
Verlag: Vincentz Network


The book deals with the applications of modern analysis techniques in paint analysis with a special focus on surface analysis. Topics covered include: * Surface cleaning, and how to be sure a visually 'clean' surface is truly free from residues before applying a coating; * Ensuring the paint and painted substrate match on a chemical basis, in order to achieve good adhesion results; * Pretreatments to improve paint adhesion; * Ingredients of paint, and how they behave with respect to the surface to be painted; * The effect paint additives have on paint adhesion; * The effect polymer substrates, including various polymer additives, have on paint adhesion; * New polymer types and polymer additives used in the automotive industry, and their implications for paint manufacture and application. The questions surrounding paint adhesion often can't be answered by simple tests or classical chemical analysis because they require the ability to analyse very small amounts of substances with a high surface sensitivity at the same time. Roger Dietrich sets out in detail the methods needed for these analytical processes.

- A practical guide to the techniques of paint analysis, from methodology to the interpretation of results
- Full coverage of key aspects such as surface cleaning, adhesion, paint ingredients and additives
- Explores the effect of polymer substrates and their additives to paint adhesion, including new polymers used in the automotive industry

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Zielgruppe


Anyone involved in delvelopment, procuction and testing of coatings and paints.


Autoren/Hrsg.


Weitere Infos & Material


Surface: definition; Optical light microscopy; Infrared spectroscopy;Time of flight secondary ion mass spectrometry;
Scanning electron microscopy;Electron microanalysis; X-Ray photoelectron spectroscopy



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