Buch, Englisch, 232 Seiten, Print PDF, Format (B × H): 161 mm x 240 mm, Gewicht: 520 g
Buch, Englisch, 232 Seiten, Print PDF, Format (B × H): 161 mm x 240 mm, Gewicht: 520 g
ISBN: 978-0-19-852034-4
Verlag: ACADEMIC
Layered metal-insulator-semiconductor microstructures have become an important research area in semiconductor microelectronics. New devices utilize phenomena occuring at or near the semiconductor surface directly.
This monograph provides a survey of the diverse experimental and theoretical results for electron and hole transport in surface and subsurface regions of semiconductors, with an emphasis on the mechanisms involved and special measurement procedures necessary, for example in Hall current measurements.
This English edition has been substantially revised and updated from the original Russian edition.
Fachgebiete
Weitere Infos & Material
- 1: Electrostatic interaction between different parts of an MIS structure and its influence on charge carrier transport
- 2: Hall effect and magnetoresistance
- 3: Effects caused by Lorentz force acting normal to the surface
- 4: Energy quantization and electron and hole transport in surface channels
- 5: Two-dimensional excitons and non-equilibrium plasma
- 6: Surface region parameters for low charge carrier densities
