Atomic Force Microscopy

Erscheinungsjahr 2010
ISBN: 978-0-19-957045-4
Verlag: Oxford University Press

Buch, Englisch, 256 Seiten, Print PDF, Format (B × H): 174 mm x 256 mm, Gewicht: 660 g

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

Zielgruppe

Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

Autoren/Hrsg.

Eaton, Peter

West, Paul

Fachgebiete

• Naturwissenschaften Physik Quantenphysik
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
• Technische Wissenschaften Technik Allgemein Physik, Chemie für Ingenieure
• Technische Wissenschaften Technik Allgemein Nanotechnologie

Inhaltsverzeichnis

- 1: Introduction

- 2: Instrumental Aspects of AFM

- 3: AFM Modes

- 4: Measuring AFM Images

- 5: Image Processing in AFM

- 6: Image Artifacts in AFM

- 7: Applications of AFM

- Appendix 1: AFM Standards and Calibration Specimens

- Appendix 2: AFM Software

Über Autor(innen)

Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.

Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.