Liebe Besucherinnen und Besucher,
aufgrund unseres Sommerfestes sind wir am 03. September 2026 bis 14 Uhr erreichbar. Am 04. September 2026 sind wir wieder wie gewohnt für Sie da. Vielen Dank für Ihr Verständnis.
Ihr Team von Sack Fachmedien
Electrical Behavior in Harsh Environments
Buch, Englisch, 216 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 506 g
ISBN: 978-3-031-29085-5
Verlag: Springer
This book describes in detail the semiconductor physics and the effects of the high temperatures and ionizing radiations in the electrical behavior of the Metal-OxideSemiconductor Field Effect Transistors (MOSFETs), implemented with the first and second generations of the differentiated layout styles. The authors demonstrate a variety of innovative layout styles for MOSFETs, enabling readers to design analog and RF MOSFETs that operate in a high-temperature wide range and an ionizing radiation environment with high electrical performance and reduced die area.
Zielgruppe
Professional/practitioner
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Chapter 1. Introduction.- Chapter 2. Basic concepts of the semiconductor physics.- Chapter 3. The electrical characteristics of the semiconductor at high temperatures.- Chapter 4. The MOSFET.- Chapter 5. The First Generation of the Unconventional Layout Styles for MOSFETs.- Chapter 6. The Ionizing Radiations Effects in Electrical Parameters and Figures of Merit of MOSFETs.- Chapter 7. The Ionizing Radiations Effects in Electrical Parameters and Figures of Merit of MOSFETs.- Chapter 8. The High Temperature Effects in Electrical Parameters of Mosfets and the Results Obtained of the First and Second Generation.




