Electron Microscopy and Analysis

3. Auflage 2000
ISBN: 978-0-7484-0968-6
Verlag: CRC Press

Buch, Englisch, 264 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 406 g

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Autoren/Hrsg.

Goodhew, Peter J.

Humphreys, John

Beanland, Richard

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index

Über Autor(innen)

Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.