Direct Conversion Semiconductor Radiation Detectors using Si, CdTe and CdZnTe

Erscheinungsjahr 2025
ISBN: 978-3-031-94004-0
Verlag: Springer

Buch, Englisch, 203 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 492 g

This book provides readers a broad overview of some of the most recent advances in the field of direct conversion detectors. There are a good mixture of general chapters in both technology and applications. Readers will enjoy an in-depth review of the research topics conducted at leading research institutions in the world. The signal conversion of the direct conversion into analogue/digital value is covered and the author also provides a review of ROIC (Read Out Integrated Circuits) chips used for direct image sensors. This book should be an excellent reference for people already working in the field as well as for people wishing to enter it.

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Iniewski, Krzysztof Kris

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde

Inhaltsverzeichnis

Chapter 1. Introduction – Motivation behind using semiconductor materials for radiation detection.- Chapter 2. Si, GaAs and CdTe/CZT Material Properties.- Chapter 3. Semiconductor Detector Device Concepts.- Chapter 4. CMOS Read-Out Circuits.- Chapter 5. Direct Conversion in Medical Imaging Applications.- Chapter 6. Direct Conversion in Computed Tomography.- Chapter 7. Direct Conversion in Baggage Scanning.- Chapter 8. Direct Conversion in Non-destructive Material Testing.- Chapter 9. Artificial Intelligence in Direct Detection Applications.- Chapter 10. Future applications of direct conversion.

Über Autor(innen)

Krzysztof (Kris) Iniewski is director of detector architecture and applications at Redlen Technologies Inc. in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CdZnTe detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.

Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 25+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Springer, Wiley, Cambridge University Press, Mc-Graw Hill, and CRC Press. He is a frequent invited speaker and has consulted for multiple organizations internationally. Recent metrics analysis showed: h index = 33, i10 index = 100, number of citations = 4259.