Iwanczyk / Iniewski | Radiation Detection Systems | Buch | 978-1-032-11342-5 | www.sack.de

Buch, Englisch, 654 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 1210 g

Reihe: Devices, Circuits, and Systems

Iwanczyk / Iniewski

Radiation Detection Systems

Two Volume Set
2. Auflage 2024
ISBN: 978-1-032-11342-5
Verlag: Taylor & Francis Ltd

Two Volume Set

Buch, Englisch, 654 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 1210 g

Reihe: Devices, Circuits, and Systems

ISBN: 978-1-032-11342-5
Verlag: Taylor & Francis Ltd


The advances in semiconductor detectors, scintillators, photodetectors such as SiPM, and readout electronics in the past decades have led to significant progress in terms of performance and greater choice of the detection tools in many applications. This second edition of Radiation Detection Systems presents the state-of-the-art in the design of detectors and integrated circuit design, in the context of medical imaging using ionizing radiation. The material in the book has been divided into two volumes. The first volume on Sensor Materials, Systems, Technology and Characterization Measurements puts more emphasis on sensor materials, detector and front electronics technology and designs as well as system optimization for different applications. It also includes characterization measurements of the developed detection systems. The second volume on Medical Imaging, Industrial Testing and Security Applications is devoted to more specific applications of detection systems in medical imaging, industrial testing and security applications. However, there is an unavoidable certain overlap in topics between both volumes. With its combined coverage of new materials and innovative new system approaches, as well as a succinct overview of recent developments, this two volumes set is an invaluable tool for any engineer, professional, or student working in electronics or an associated field.

Iwanczyk / Iniewski Radiation Detection Systems jetzt bestellen!

Zielgruppe


Academic

Weitere Infos & Material


Jan Iwanczyk is a consultant to Universities and private companies since July 2017. He has served as a President and CEO of DxRay, Inc., Northridge, California, from 2005 to 2017.

Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications.



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.