Metrology for THz Communications

Findings from DFG FOR 2863 Meteracom
Erscheinungsjahr 2026
ISBN: 978-3-032-01985-1
Verlag: Springer

Buch, Englisch, 556 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 1019 g

Reihe: Springer Series in Optical Sciences

This open access book provides a state-of-the-art overview of metrology for upcoming THz communications, considered a key component of next generation wireless communication systems. Effective methods to conduct and evaluate measurements are crucial for the advancement of THz communication systems. However, at the start of the project in 2019, metrology at THz frequencies was still in its infancy, and thus far had only addressed detector calibration to characterize ultrafast devices as well as measuring uncertainty analyses of different spectrometer types available at THz frequencies. 

This book highlights how the grand challenge of metrology in THz communication measurements was addressed systematically in the publicly funded project DFG FOR 2863 Meteracom (Metrology for Terahertz Communications). It delves into four distinct and foundational project areas: traceability to the International System of Units (SI), characterization of the measurement system itself, metrological characterization of the RF components and the propagation channel, and measurements required for enabling the functionality of THz communications.

Zielgruppe

Research

Autoren/Hrsg.

Kürner, Thomas

Doeker, Tobias

Humphreys, David

Kleine-Ostmann, Thomas

Schneider, Thomas

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Drahtlostechnologie
• Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik
• Naturwissenschaften Physik Quantenphysik Atom- und Molekülphysik
• Naturwissenschaften Physik Elektromagnetismus Optik
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik

Inhaltsverzeichnis

Chapter 1. Introduction.- Chapter 2. Metrology – Definition, Use Cases, Added Value.- Chapter 3. RF Power Metrology.- Chapter 4. Phase Noise Metrology.- Chapter 5. Waveform Metrology.- Chapter 6. Vector Network Analysis.- Chapter 7. Terahertz Time-Domain Spectroscopy.- Chapter 8. Channel Sounding.- Chapter 9. Photonics Assisted Signal Processing.- Chapter 10. Ray Tracing for Metrology.- Chapter 11. Hardware Acceleration.- Chapter 12. Waveform Traceability Chain to coaxial EOS.- Chapter 13. Characterising VNA Measurements of Time-Varying Sub-Terahertz Transmissions.- Chapter 14. THz Waveform Traceability.- Chapter 15. Constellation Diagrams, EVM, and Error Correction.- Chapter 16. Architecture for Channel Sounding.- Chapter 17. Multidimensional Parameter Estimation for Channel Sounding.- Chapter 18. Variable Reference Structure for THz Channel Sounding.- Chapter 19. Artefacts for Channel Sounding Performance Evaluation.- Chapter 20. Integrated Photonics Assisted Signal Processing and Thermal Crosstalk.- Chapter 21. Error Metrics for Photonics Assisted Signal Processing.- Chapter 22. Photonics Assisted Signal Processing Systems using Parallelisation in Time and Frequency Domain.- Chapter 23. Metrological Analysis of Non-idealities for Photonics Assisted Signal Processing.- Chapter 24. Metrology of mmW- and THz-Frequency- and Time-DomainWaveforms.- Chapter 25. Behavioural Characterization of Nonlinear Distortion.- Chapter 26. Electronic Signal Generation.- Chapter 27. Electronic Signal Conversion, Signal Amplification and Distortion Mechanisms.- Chapter 28. Frequency Synthesis based on MLLs.- Chapter 29. Integrated Photonically Assisted Samplers.- Chapter 30. Atmospheric Aspects.- Chapter 31. Building Materials.- Chapter 32. Interaction of Objects with THz Beams.- Chapter 33. Multipath Propagation in Rich Scattering.- Chapter 34. Time-variant Propagation Channel including Metrics and Multi-link Connection. Chapter 35. Physical Layer Security. Chapter 36. Simulation and Modelling of Electronic and Photonic Components.- Chapter 37. Link- and System-Level Simulation Towards Digital Twinning.- Chapter 38. Trustworthy Modulation Recognition.- Chapter 39. THz Networks with Intelligent Control and Digital Twining.- Chapter 40. Device Discovery.- Chapter 41. Beam Tracking and Switching.

Über Autor(innen)

Thomas Kürner (Fellow IEEE) received his Dipl.-Ing. degree in Electrical Engineering in 1990, and his Dr.-Ing. degree in 1993, both from University of Karlsruhe. From 1990 to 1994 he was with the Institut für Höchstfrequenztechnik und Elektronik (IHE) at the University of Karlsruhe. From 1994 to 2003, he was with the radio network planning department at the headquarters of the cellular operator E-Plus Mobilfunk GmbH & Co KG, Düsseldorf. Since 2003 he is Full University Professor for Mobile Radio Systems at TU Braunschweig. Currently he is chairing the IEEE 802.15 SC THz and the ETSI ISG THz. He has been Spokesman of the German DFG-Research Unit Meteracom. He is one of the editors of the Springer book on "THz Communications”.
Tobias Doeker received his B.Sc. degree in Electrical Engineering from Hamburg University of Applied Sciences in 2017 and his M.Sc. degree in Electrical Engineering from TU Braunschweig in 2019. Besides, from 2013 to 2019 he was a student trainee at Lufthansa Technik AG in Hamburg. In November 2019, he joined the Institute for Communications Technology at TU Braunschweig as a researcher where he is currently working towards his Ph.D. degree. His research interests focus on THz indoor communication at 300 GHz, particularly on radio channel measurements and characterization, and device discovery and beam tracking. 
David A. Humphreys (CEng, Fellow IET, Life Senior Member IEEE) received a PhD in Electronic Engineering (1990, London University). At the National Physical Laboratory, UK (1978 to 2022) he developed metrology for photodiodes at up to mm-wave frequencies, optical wavelength capabilities for optical communications instrumentation and waveform metrology for RF communications, including several Euramet projects and international collaborations. He was Vice-Chair of the IEEE 1765 pre-standards group “The uncertainties in Error-Vector-Measurement (EVM)”: He was awarded the IEE Ambrose Fleming Premium in 1987 and is currently a Mercator Fellow of Meteracom, a Visiting Industrial Research Fellow (University of Bristol, UK) and a Guest worker at Physikalisch-Technische Bundesanstalt (PTB) in Braunschweig.
Thomas Kleine-Ostmann studied Electrical Engineering at the TU Braunschweig and at Virginia Polytechnic Institute and State University. He received his M. Sc. degree in 1999, his Dipl.-Ing. degree in 2001 and his Dr.-Ing. degree in 2005. In 2003, he was awarded the Kaiser Friedrich Research Prize. Since 2006, he has been a scientist at PTB working on the representation and dissemination of the unit of electric field strength, electromagnetic compatibility as well as further development of antenna and submillimeter wave metrology and has been head of the High Frequency and Fields Department since 2020. At TU Braunschweig, he teaches High Frequency and Mobile Communications Metrology and habilitated in the field of High Frequency Technology. 
Thomas Schneider is the head of the THz-photonics group at the TU Braunschweig. He received the diploma degree in Electrical Engineering from Humboldt Universität zu Berlin in 1995, and the Ph.D. degree in physics from BTU Cottbus in 2000. From 2000 to 2014 he was with the Hochschule für Telekommunikation (HfT) in Leipzig. From 2006 to 2014 he was the head of the Institut für Hochfrequenztechnik at HfT. Dr. Schneider was a guest professor at the Swiss Federal Institute of Technology (EPFL), Lausanne, a guest scientist at Deutsche Telekom Innovation Laboratories and Fraunhofer Heinrich Hertz Institute Berlin. His current research interests include Terahertz metrology, integrated and microwave photonics, photon-phonon coupling in nano-waveguides and high-bandwidth signal processing with low-bandwidth electronics.