Radiation Tolerant Nyquist Analog to Digital Converters

Erscheinungsjahr 2025
ISBN: 978-3-031-95598-3
Verlag: Springer

Buch, Englisch, 186 Seiten, Format (B × H): 173 mm x 246 mm, Gewicht: 559 g

Reihe: Synthesis Lectures on Engineering, Science, and Technology

This book presents the detailed design considerations and techniques for radiation-tolerant (RT) Nyquist analog-to-digital converters (ADC). It begins with the fundamental radiation effects in space and its consequences in modern CMOS technology. Next, radiation effects on ADCs from the transistor level to the architectural level are examined and a detailed design tradeoffs and strategies for radiation-tolerant ADCs are described. The theory and hardening techniques are supported by measurement data from a high-performance RT-ADC prototype chip. Two important flows, which are a technology evaluation flow and an RT IC design flow, are also covered, in order to give a complete overview on how to achieve an effective RT circuits design.

Zielgruppe

Research

Autoren/Hrsg.

Li, Zheyi

Berti, Laurent

Leroux, Paul

Fachgebiete

• Mathematik | Informatik EDV | Informatik Technische Informatik Eingebettete Systeme
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise

Inhaltsverzeichnis

Chapter 1: Introduction.- Chapter 2: Radiation Effects in CMOS Technology and Mitigating Techniques.- Chapter 3: Radiation Hardened IC Design and Evaluation Flow.

Über Autor(innen)

Zheyi Li received the B.Eng. degree in Electrical Engineering from Xidian University, Xi'an, China, in 2013 and the M.Sc. degree in Electrical Engineering from Eindhoven University of Technology, the Netherlands, in 2017. From 2018 to 2024, he worked as a research assistant on a joint PhD topic "Radiation hardened high-speed ADC for imec’s next generation DARE platform" from Katholieke Universiteit Leuven (KUL) and Interuniversity Microelectronics Center (imec). Since 2022, he has been a senior researcher at IMEC in Belgium. His research interests include the design of analog/mixed-signal circuits and systems, radiation effects in microelectronics and the design of ICs for harsh environments.

Laurent Berti received the M.Sc. degree in electronics in 1997 from the Université Libre de Bruxelles, Belgium. From 1997 to 2000, he continued to work as a research assistant after graduation. In 2000 and 2002. he joined Alcatel Bell and ST Microelectronics as an analog designer, respectively. From 2006 to 2012, he was a co-founder of nSilition. From 2013 to 2018, he worked at IMEC as a senior analog designer. Currently, he is the team leader and technical leader of the IC-link analog design team at IMEC since 2018. He and his team mainly work on customized analog/mixed-signal/RF circuits and systems, that are related to radiation-hardened applications, quantum sensing, biomedical etc.

Paul Leroux received the M.Sc. degree and Ph.D. degree in electronic engineering from the KU Leuven (University of Leuven), Belgium, in 1999 and 2004, respectively. From 1999 to 2004, he was a Teaching and Research Assistant within the MICAS research group of the KU Leuven Department of Electrical Engineering (ESAT). Currently, he is a full professor at the KU Leuven Department of Electrical Engineering (ESAT), where he founded the ADVISE research lab. Since August 2016, he has been Campus Chair of KU Leuven, Geel Campus. His current research activities within the ADVISE research group focus on radiation-hardened analog and mixed-signal IC design for communication and instrumentation in space, high-energy physics and nuclear energy applications. His group is part of the CERN CMS collaboration, where Prof. Leroux is acting as KU Leuven team leader.  Paul Leroux has (co)authored over 250 papers in international journals and conference proceedings. He is also the KU Leuven program director of the ERASMUS MUNDUS Joint Master on Radiation and its Effect on MicroElectronics and Photonics Technologies (RADMEP) and director of the joint KU Leuven and SCK-CEN spin-off company MAGICS Technologies. In 2010, he received the SCK-CEN Prof. Roger Van Geen Award from the FWO and FNRS for his highly innovative work on IC design for harsh radiation environments. Prof. Leroux is a Senior Member of IEEE.