Optical Measurement Techniques

Fundamentals, Advances, and Applications
Erscheinungsjahr 2026
ISBN: 978-981-9264-17-9
Verlag: Springer

Buch, Englisch, 237 Seiten, Format (B × H): 155 mm x 235 mm

Reihe: Springer Series in Measurement Science and Technology

This book introduces the latest advances in optical measurement methods, highlighting both fundamental principles and practical applications. For three-dimensional complex structures, accurate restoration of geometry and precise extraction of shape parameters are essential to evaluate defect rates, reliability, and performance. Optical measurement provides a powerful solution to these challenges, offering high accuracy, rapid speed, and non-contact operation—making it a cornerstone technology for advanced manufacturing.

The book presents a comprehensive overview of optical measurement systems, which integrate optoelectronic techniques with physical quantity measurement and computing technologies to achieve intelligent, automated, and digital recording, display, storage, and transmission. Core methods such as laser interference, beam diffraction, spectral analysis, machine vision, and image processing are discussed in detail, forming the theoretical foundation for instruments including microscopes, optical measurement devices, and coordinate measuring machines.

Richly illustrated with figures, tables, and representative research results, the book covers measurement of diverse parameters such as distance, topography, gas concentration, refractive index, velocity, flow rate, rotational speed, deformation, and strain. It brings together new theories and emerging technologies, providing technical support for industrial testing, material analysis, product development, defect detection, and circuit evaluation.

This book is written for graduate students, researchers, and professionals engaged in optical detection and precision measurement. It serves as both a reference and a guide, equipping readers with the knowledge and tools to apply advanced optical measurement techniques across a wide range of scientific and industrial applications.

Zielgruppe

Research

Autoren/Hrsg.

Liu, Zhengjun

Li, Yutong

Fachgebiete

• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
• Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik
• Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik

Inhaltsverzeichnis

Toc.- chapter.

Über Autor(innen)

Zhengjun Liu is a professor at the School of Physics, Harbin Institute of Technology (HIT), China. He received his Ph.D. from the Physics Department of HIT, China, in July 2007. He currently serves as a standing member of the Holographic Special Committee of the Optical Society, a senior member of the American Optical Society (OSA), a member of the Chinese Optical Engineering Society, and a member of the IEEE. His research focuses on optical information processing, image processing, computational optical imaging, and other related fields. He published more than 200 papers and 6 books. He has an H-index of 41.

Yutong Li is an assistant researcher at the School of Physics, HIT, China. She obtained her Ph.D. from the Physics Department of HIT in June 2023 and started working at the School of Physics in December 2023. In 2024, she was awarded a project funded by the National Natural Science Foundation of China. Her current research interests encompass optical image processing, computational imaging, super-resolution imaging, optical information security, and diffraction imaging.