Design and Analysis of Accelerated Life Tests

1. Auflage 2027
ISBN: 978-1-4987-5344-9
Verlag: Taylor & Francis Inc

Buch, Englisch, 304 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 453 g

Accelerated life tests (ALTs) have become an indispensable tool for reliability engineers to quantify a product’s reliability, and for product managers to make product release decisions. However, there are many common misuses of ALTs and misinterpretations of their results. This book provides a framework for the proper design and analysis of ALTs. It compares ALTs with other industrial testing experiments, and provides guidance on their appropriate application. It features lots of examples using real data from industrial experiments, and provides statistical software for their implementation. It can be used as a textbook for students of reliability, or as a reference for practitioners

Autoren/Hrsg.

Pan, Rong

Fachgebiete

• Mathematik | Informatik Mathematik Stochastik
• Wirtschaftswissenschaften Betriebswirtschaft Management Qualitätsmanagement, Qualitätssicherung (QS), Total Quality Management (TQM)
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Industrielle Qualitätskontrolle

Inhaltsverzeichnis

Introduction to Reliability Testing; Lifetime distributions; Acceleration models; Planning ALTs with Single Stress Factor; Planning ALTs with Multiple Stress Factors; Test Plans for Model Checking; Tests with Blocking and Subsampling; Other reliability tests.