Prakash / Singh / Davim | Characterization, Testing, Measurement, and Metrology | Buch | 978-0-367-55494-1 | sack.de

Buch, Englisch, 204 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 295 g

Reihe: Manufacturing Design and Technology

Prakash / Singh / Davim

Characterization, Testing, Measurement, and Metrology


1. Auflage 2024
ISBN: 978-0-367-55494-1
Verlag: Taylor & Francis Ltd (Sales)

Buch, Englisch, 204 Seiten, Format (B × H): 156 mm x 234 mm, Gewicht: 295 g

Reihe: Manufacturing Design and Technology

ISBN: 978-0-367-55494-1
Verlag: Taylor & Francis Ltd (Sales)


This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years.

The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.

The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.

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Zielgruppe


Academic and Professional

Weitere Infos & Material


1. Mechanical Property Characterization of Construction Materials. 2. Evaluation of Material Surface Integrity. 3. Characterizations: SEM/FESEM, EDS, XRD, XPS, AFM, TEM, STEM, FTIR, DSC, TGA, DMA. 4. Mechanical Behaviour: Fracture, Damage, Fatigue. 5. Tribology and Wear. 6. Interfaces and Interphases. 7. Creep and Aggressive Environment. 8. Corrosion. 9. Measurement, Performance Analysis, and Characterization of Materials, Devices, and Systems
using Advanced Technologies. 10. Characterization of Surfaces and the Relationship between Surface Properties and their
Applications. 11. Surface Metrology - Measurement and Characterization of Surface Topography including
Functional Properties of Surfaces. 12. Measurement & Metrology in Materials and Advanced Manufacturing: Roughness, Forces, Corrosion, Wear, Crack Propagation and Fatigue. 13. Monitoring and Control of Machining/Manufacturing Processing of Advanced Materials. 14. Optimization of Machining/Manufacturing Processing. 15. Computational Intelligence: Neural, fuzzy, Genetic, and Swarm Particle Optimization. 16. Vision-Based Control and Control Engineering.


Chander Prakash, Sunpreet Singh, J. Paulo Davim



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