Rudman | Low-Temperature X-Ray Diffraction | Buch | 978-1-4615-8773-6 | www.sack.de

Buch, Englisch, 344 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 527 g

Reihe: Monographs in Low-Temperature Physics

Rudman

Low-Temperature X-Ray Diffraction

Apparatus and Techniques
Softcover Nachdruck of the original 1. Auflage 1976
ISBN: 978-1-4615-8773-6
Verlag: Springer

Apparatus and Techniques

Buch, Englisch, 344 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 527 g

Reihe: Monographs in Low-Temperature Physics

ISBN: 978-1-4615-8773-6
Verlag: Springer


Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature. LTXRD studies can be frustrating: There are at least two reports of investigations ruined by the loss of crystals (grown with extreme difficulty) because of the widespread power failure and blackout in the northeastern United States in late 1965. LTXRD studies can cause discomfort: In several instances, "low temperatures" have been attained by opening all the windows in the X-ray laboratory. LTXRD studies can be dangerous: It was once reported that a crys tal was lost because a laboratory assistant fell down a flight of stairs and lay unconscious for about an hour on his way to refilling a liquid-nitrogen (LN2 ) dewar. This last report indicated the disposition of the crystal but not that of the laboratory assistant. However, in general, the results of low-temperature X-ray diffraction investigations cannot be obtained in any other manner, and one is well compensated for the effort expended in constructing and maintaining a low-temperature system. Crystal-structure analyses of solidified liquids and gases, phase transformation investigations, accurate crystal-structure analy ses and electron-density maps, thermal expansion measurements, and defect structure studies are a few of the many important applications of LTXRD.

Rudman Low-Temperature X-Ray Diffraction jetzt bestellen!

Zielgruppe


Research


Autoren/Hrsg.


Weitere Infos & Material


I: Introduction and Applications.- 1. Introduction.- 2. Applications.- II: Low-Temperature X-Ray Diffraction Apparatus.- 3. Gas-Stream Cooling Apparatus.- 4. Conduction-Cooling Apparatus.- 5. Immersion-Cooling Apparatus.- III: Low-Temperature X-Ray Diffraction Techniques.- 6. Sample Preparation.- 7. Crystal-Growing-Techniques.- 8. Data Collection and Reduction.- 9. Future Trends in Low-Temperature X-Ray Diffraction.- IV: Appendices, Bibliography, and Index.- Appendix 1. Temperature Measurement.- Appendix 2. Cryogenic Liquids and Solids.- Appendix 3. Mechanical Refrigeration.- Appendix 4. Joule-Thomson Expansion Cooling.- Appendix 5. Thermoelectric Devices.- Appendix 6. Dewars.- Appendix 7. Transfer Lines.- Appendix 8. Insulation.- Appendix 9. Frost Prevention.- Appendix 10. Miscellaneous Gas-Flow Accessories.- Appendix 11. Low-Temperature Adhesives and Greases.- Appendix 12. List of Manufacturers of Low-Temperature Equipment and Accessories.- Appendix 13. Recommended Procedure for Describing Low-Temperature Apparatus in Publications.- B.1. Introduction.- B.2. Alphabetical Listing.- B.3. Apparatus Code-Number Listing.- B.4. Techniques and Applications Code-Number Listing.



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.