Liebe Besucherinnen und Besucher,
aufgrund unseres Sommerfestes sind wir am 03. September 2026 bis 14 Uhr erreichbar. Am 04. September 2026 sind wir wieder wie gewohnt für Sie da. Vielen Dank für Ihr Verständnis.
Ihr Team von Sack Fachmedien
Buch, Englisch, 242 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 613 g
Buch, Englisch, 242 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 613 g
Reihe: Indian Institute of Metals Series
ISBN: 978-981-19-3508-4
Verlag: Springer Nature Singapore
This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Introduction.- Electromagnetic Waves and Electron Waves.- Fourier Analysis and Fourier Transformation.- Transmission Electron Microscope.- Electron Diffraction.- Optical Microscopy.- Transmission Electron Microscopy.- Lens-less Electron Microscopy




