Electron Dynamics by Inelastic X-Ray Scattering

Erscheinungsjahr 2007
ISBN: 978-0-19-851017-8
Verlag: OUP Oxford

Buch, Englisch, 606 Seiten, Print PDF, Format (B × H): 161 mm x 240 mm, Gewicht: 1065 g

Knowledge of the dynamics of many-electron systems is of fundamental importance to all disciplines of condensed matter physics. A very effective access to electron dynamics is offered by inelastic X-ray scattering (IXS) spectroscopy. The double differential scattering cross section for IXS is directly related to the time-dependent two-particle density correlation function, and, for large momentum and energy transfer (Compton limit) to the electron momentum distribution. Moreover, resonant inelastic X-ray scattering (RIXS) enables the study of electron dynamics via electronic excitations in a very selective manner (e.g. selectively spin, crystal momentum, or symmetry), so that other methods are efficaciously complemented.

The progress of IXS spectroscopy is intimately related to the growing range of applications of synchrotron radiation. The aim of the book is to provide the growing community of researchers with accounts of experimental methods, instrumentation, and data analysis of IXS, with representative examples of successful applications, and with the theoretical framework for interpretations of the measurements.

Autoren/Hrsg.

Schuelke, Winfried

Fachgebiete

• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Metallurgie
• Naturwissenschaften Chemie Chemie Allgemein Chemometrik, Chemoinformatik
• Naturwissenschaften Physik Quantenphysik Hochenergiephysik
• Naturwissenschaften Physik Mechanik Klassische Mechanik, Newtonsche Mechanik
• Naturwissenschaften Physik Thermodynamik Plasmaphysik
• Naturwissenschaften Physik Quantenphysik Atom- und Molekülphysik
• Naturwissenschaften Chemie Physikalische Chemie Quantenchemie, Theoretische Chemie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Metallische Werkstoffe
• Naturwissenschaften Physik Physik Allgemein
• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie

Inhaltsverzeichnis

- 1: Introductory Survey

- 2: Non-resonant inelastic X-ray scattering; Regime of Characteristic valence electron excitations

- 3: Non-resonant inelastic X-ray scattering: Regime of core-electron excitations (X-ray Raman scattering)

- 4: The Compton scattering regime

- 5: Resonant inelastic X-ray scattering (RIXS)

- 6: Theoretical foundation

Über Autor(innen)

Winfried Schülke
Professor Emeritus
Institute of Physics
University Dortmund
Germany
; 1959-1966 Scientific Assistant, Institute of Experimental Physics, Martin-Luther-University, Halle/Saale, GDR
1966-1975 Head Assistant, Section of Physics, Martin-Luther-University, Halle/Saale, GDR
1975-1977 Scientist at the Institute of Physics, University of Dortmund

1977-1980 Assistant Professor of Physics, University of Dortmund
1980-2001 Full Professor of Physics, University of Dortmund
2001- Present Professor Emeritus, University of Dortmund