Kelvin Probe for Surface Engineering

Fundamentals and Design
Erscheinungsjahr 2026
ISBN: 978-3-032-25576-1
Verlag: Springer Nature Switzerland AG

Buch, Englisch, 178 Seiten, Format (B × H): 155 mm x 235 mm

This book focuses on presenting a comprehensive understanding of the Kelvin probe technique, emphasizing its significance as a non-destructive and powerful tool for measuring the work function of metals and semiconductor surfaces. It brings together scattered knowledge by outlining essential fundamentals, key design considerations, and practical precautions required for the fabrication and assembly of Kelvin probe equipment. The content also highlights the expanding potential of the technique in emerging fields such as nano and bio systems, along with its applications in advanced experiments like Photoemission Yield Spectroscopy and Surface Photovoltage Spectroscopy. Additionally, the book offers valuable insights into real-world implementation, drawing from the process of designing and developing a Kelvin probe setup. Structurally, it integrates theoretical concepts with applied aspects, making it both informative and practical. This book is particularly useful for researchers, academicians, and professionals working in surface science, surface engineering, and related interdisciplinary areas, especially those interested in instrumentation, experimental techniques, and material characterization.

Zielgruppe

Graduate

Autoren/Hrsg.

Subrahmanyam, A.

Kumar, Suresh

Fachgebiete

• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde

Inhaltsverzeichnis

Introduction to Surfaces and Interfaces.- The Thermodynamics of Surfaces and Definition of Work Function and Measurement.- Design of the Kelvin Probe and the Methods of Measurement of Contact Potential Difference (CPD).- Photoemission Yield Spectroscopy(PEYS).- Surface Photovoltage Spetroscopy (SPV) of Semiconductor Surfaces.

Über Autor(innen)

Dr. Subrahmanyam has teaching and research experience spanning over 38 years in Indian Institute of Technology Madras, Chennai. Presently, he is a senior professor (retired). His main area of research is in thin films and surface engineering, basics of plasma, and bio-medical engineering. He has established a thin film laboratory equipped with electron beam evaporation, DC and RF magnetron sputtering, pulsed laser deposition (PLD), and sol-gel techniques. His main area is on metal oxide thin films (ITO, ZnO, WO3, VO2) spanning the industrial applications of Transparent Conducting oxides (TCO) and electrochromics (WO3) for smart windows. He is the author (along with Dr Suresh) of the first book on Kelvin Probe: The Kelvin Probe for Surface Engineering: Fundamentals and Design (ISBN 9781420080773) published by Ane Books, India, and CRC Press, USA (in 2010).

Dr. Suresh Kumar has been working on the design and development of innovative surface measurement techniques over the past twenty years, with special interest on Kelvin Probe and its applications to semiconductor research. His research interests include design, fabrication and characterization of semiconductor devices, study of surfaces and interfaces, thin films, nano-materials, low-dimensional artificial structures, and renewable energy. He is also an expert in semiconductor characterization techniques like contact potential difference (CPD) measurements, surface photo-voltage spectroscopy, photoemission yield spectroscopy, and impedance spectroscopy. He has authored several research papers and delivered invited talks. In the year 2007, Dr. Suresh Kumar has been awarded Professor A.L. Laskar Prize (for the best Ph.D. thesis) for his thesis “Design and Fabrication of Kelvin Probe and Surface Passivation Studies of GaAs.” Dr. Suresh Kumar is presently the president of KG Design Services Pvt. Ltd., India.