Proceedings of the 11th International Conference on Modelling, Identification and Control (Icmic2019)

2020. Auflage 2020
ISBN: 978-981-15-0473-0
Verlag: Springer

Buch, Englisch, 1387 Seiten, Format (B × H): 163 mm x 239 mm, Gewicht: 2259 g

Reihe: Lecture Notes in Electrical Engineering

This book includes original, peer-reviewed research papers from the 11th International Conference on Modelling, Identification and Control (ICMIC2019), held in Tianjin, China on July 13-15, 2019. The topics covered include but are not limited to: System Identification, Linear/Nonlinear Control Systems, Data-driven Modelling and Control, Process Modelling and Process Control, Fault Diagnosis and Reliable Control, Intelligent Systems, and Machine Learning and Artificial Intelligence.The papers showcased here share the latest findings on methodologies, algorithms and applications in modelling, identification, and control, integrated with Artificial Intelligence (AI), making the book a valuable asset for researchers, engineers, and university students alike.   

Zielgruppe

Research

Autoren/Hrsg.

Wang, Rui

Chen, Zengqiang

Zhang, Weicun

Zhu, Quanmin

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Regelungstechnik
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik
• Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz
• Naturwissenschaften Physik Angewandte Physik Soziophysik, Wirtschaftsphysik

Inhaltsverzeichnis

System Identification.- Data-driven Modeling and Control.- Adaptive Control.- Linear/Nonlinear Control Systems.- Predictive Control.- Optimization and Optimal Control.- Process Modeling and Process Control.- Cooperative Control Systems.- Networked Control Systems.- Intelligent Systems.- Soft Computing Techniques.- Signal Processing and Information Fusion.- Fault Diagnosis and Reliable Control.- Vibration Analysis.- Noise Measuring and Control.- Condition Monitoring.- Structural Dynamics.- Pattern Recognition.- Machine Learning and Artificial Intelligence.

Über Autor(innen)