Warner / Grung | Mosfet Theory and Design | Buch | 978-0-19-511642-7 | www.sack.de

Buch, Englisch, 272 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 446 g

Warner / Grung

Mosfet Theory and Design


Erscheinungsjahr 2000
ISBN: 978-0-19-511642-7
Verlag: Oxford University Press

Buch, Englisch, 272 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 446 g

ISBN: 978-0-19-511642-7
Verlag: Oxford University Press


MOSFET Theory and Design presents clearly and in depth the theory and design of the MOSFET device, catering to its dominant position in today's microelectronics technology. This slim volume carefully builds examples from a simple level to more complex, real-life cases. The text includes a detailed bibliography and numerous problems sets - analytic, computer, and design - as well as original analyses, in-text exercises, and chapter summaries and check lists. It is appropriate for a one-semester course for junior, senior, or graduate students in engineering. A solutions manual is available free to adopters of the text.

Warner / Grung Mosfet Theory and Design jetzt bestellen!

Weitere Infos & Material


- Chapter 1 Basic MOSFET Theory

- 1-1: Field-Effect Transistors

- 1-2: Mosfet Definitions

- 1-3: Rudimentary Analysis

- 1-4: Current-Voltage Equations

- 1-5: Universal Transfer Characteristics

- 1-6: Transconductance

- 1-7: Inverter Options

- Chapter 2 MOS-Capacitor Phenomena

- 2-1: Oxide-Silicon Boundary Conditions

- 2-2: Approximate Field and Potentials Profiles

- 2-3: Accurate Band Diagram

- 2-4: Barrier-Height Difference

- 2-5: Interfacial Charge

- 2-6: Oxide Charge

- 2-7: Calculating Threshold Voltage

- Chapter 3 MOS-Capacitor Modeling

- 3-1: Exact-Analytic Surface Modeling

- 3-2: Comparing MOS and Junction Capacitances

- 3-3: Small-Signal Equivalent Circuits

- 3-4: Ideal Voltage-Dependent Capacitance

- 3-5: Real Voltage-Dependent Capacitance

- 3-6: Physics of MOS-Capacitance Crossover

- 3-7: Analysis of MOS-Capacitance Crossover

- Chapter 4 Improved MOSFET Theory

- 4-1: Channel-Junction Interactions

- 4-2: Ionic Charge Model

- 4-3: Body Effect

- 4-4: Advanced Long-Channel Models

- Chapter 5 SPICE Models

- 5-1: Level-2 Parameters

- 5-2: Level-2 Model

- 5-3: Small-Signal Applications of Model

- 5-4: Large-Signal Applications of Model

- Chapter 6 MOSFET-BJT Performance Comparisons

- 6-1: Simple-Theory Transconductance Comparison

- 6-2: Subthreshold Transconductance Theory

- 6-3: Calculating Maximum MOSFET gm/out

- 6-4: Transconductance versus Input Voltage

- 6-5: Physics of Subthreshold Transconductance

- Chapter 7 MOSFET Design for Today's ICs

- 7-1: Survey of Recent Models [e.g., BSIM 1-3]

- 7-2: Solving Key Problems [e.g., subthreshold, hot-electron, short-channel effects]

- 7-3: Additional Circuit-Design Issues [e.g., noise analysis, temperature effects, characteristic matching]

- 7-4: Related Devices [e.g., MODFET, JFET]

- 7-5: Future Trends in Device Simulation

- Appendixes

- Tables

- References

- Topics for Review

- Analytic Problems

- Computer Problems

- Design Problems

- Symbol Index

- Subject Index



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.