Woolfson | An Introduction to X-Ray Crystallography | Buch | 978-0-521-42359-5 | www.sack.de

Buch, Englisch, 414 Seiten, Format (B × H): 189 mm x 246 mm, Gewicht: 801 g

Woolfson

An Introduction to X-Ray Crystallography


2. Auflage 2003
ISBN: 978-0-521-42359-5
Verlag: Cambridge University Press

Buch, Englisch, 414 Seiten, Format (B × H): 189 mm x 246 mm, Gewicht: 801 g

ISBN: 978-0-521-42359-5
Verlag: Cambridge University Press


textbook for the advanced undergraduate or graduate student beginning a serious study of X-ray crystallography. It will be of interest both to those intending to become professional crystallographers and to those physicists, chemists, biologists, geologists, metallurgists and others who will use it as a tool in their research. All major aspects of crystallography are covered - the geometry of crystals and their symmetry, theoretical and practical aspects of diffracting X-rays by crystals and how the data may be analysed to find the symmetry of the crystal and its structure. Recent advances are fully covered, including the synchrotron as a source of X-rays, methods of solving structures from power data and the full range of techniques for solving structures from single-crystal data. A suite of computer programs is provided for carrying out many operations of data-processing and solving crystal structures - including by direct methods. While these are limited to two dimensions they fully illustrate the characteristics of three-dimensional work. These programs are required for many of the examples given at the end of each chapter but may also be used to create new examples by which students can test themselves or each other.

Woolfson An Introduction to X-Ray Crystallography jetzt bestellen!

Autoren/Hrsg.


Weitere Infos & Material


Preface to the first edition; Preface to the second edition; 1. The geometry of the crystalline state; 2. The scattering of X-rays; 3. Diffraction from a crystal; 4. The Fourier transform; 5. The experimental collection of diffraction data; 6. The factors affecting X-ray intensities; 7. The determination of space groups; 8. The determination of crystal structures; 9. Accuracy and refinement processes; References; Appendices; Physical constants and tables; Solutions to examples; Bibliography; Index.



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.