Ali Next Generation and Advanced Network Reliability Analysis

Using Markov Models and Software Reliability Engineering
1. Auflage 2018
ISBN: 978-3-030-01647-0
Verlag: Springer International Publishing
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 311 Seiten

Reihe: Engineering (R0)

This book covers reliability assessment and prediction of new technologies such as next generation networks that use cloud computing, Network Function Virtualization (NVF), Software Defined Network (SDN), Next Generation Transport, Evolving Wireless Systems, Digital VoIP Telephony, and Reliability Testing techniques specific to Next Generation Networks (NGN). This book introduces the technology to the reader first, followed by advanced reliability techniques applicable to both hardware and software reliability analysis. The book covers methodologies that can predict reliability using component failure rates to system level downtimes. The book’s goal is to familiarize the reader with analytical techniques, tools and methods necessary for analyzing very complex networks using very different technologies. The book lets readers quickly learn technologies behind currently evolving NGN and apply advanced Markov modeling and Software Reliability Engineering (SRE) techniques for assessing their operational reliability.

• Covers reliability analysis of advanced networks and provides basic mathematical tools and analysis techniques and methodology for reliability and quality assessment;
  
• Develops Markov and Software Engineering Models to predict reliability;
  
• Covers both hardware and software reliability for next generation technologies.
  

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Ali, Syed Riffat

Inhaltsverzeichnis

Introduction.- Next Generation Network.- Hardware Reliability Modeling.- Software Reliability Analysis.- Software Defined Networking.- Network Functions Virtualization.- Cloud Computing Reliability Analysis.- Next Generation Transport System.- Reliability Analysis of VoIP System.- Reliability Analysis of Wireless Systems.- Reliability Testing For Advanced Networks.- Conclusion.

Über Autor(innen)

Syed R. Ali, DEE, is currently CEO and Principal of Software Reliability Research, LLC conducting upfront research and consultation with sophisticated software tools and methodologies for companies and organizations that seek state-of-the-art reliability analysis of their products and services for Next Generation Networks (NGN), Virtualized Networks, emerging wireless and other technologies. The objective of his organization is to provide high reliability framework for assessing and measuring overall operational end-to-end reliability of complex real-time mission critical systems. Syed was principal consultant at Bell Communications Research for over 30 years and was instrumental in setting up industry wide metrics was measuring software quality at all life cycle phases. He pioneered the concept of software fault insertion techniques for increasing software reliability before its released. While at Telcordia (formerly Bellcore) he developed Telcordia’s In-Process Quality Metrics (IPQM,GR-1315), Object Oriented Process Metrics (OOPM, SR-4047), and contributed to many IEEE and ISO standards. He is author of book “Digital Switching Systems -System Reliability Analysis published by McGraw-Hill, 1997, ISBN 0-07-001069-2. Syed is an expert in the field with extensive experience in analyzing reliability of advanced network architectures around the world. He has consulted with Ericcson (Sweden), Nortel (Canada), Siemens (Germany), NEC (Japan), Alcatel, (France), Singtel (Singapore), and Fujitsu (Japan) and has supported many international standard bodies. Syed is the past chairperson of IEEE Communications and co-founder of Computer Society New York Section.  He is a frequent speaker at many IEEE and international telecommunications forums and is regarded as a leader in the field of reliability. Syed received his BSEE from Bangladesh University of Engineering & Technology (BUET), MSEE from Tuskegee University, Tuskegee Alabama and DEE from New JerseyInstitute of Technology, Newark, NJ.