E-Book, Englisch, 224 Seiten
Aliev Digital Noise Monitoring of Defect Origin
1. Auflage 2007
ISBN: 978-0-387-71754-8
Verlag: Springer-Verlag
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
E-Book, Englisch, 224 Seiten
ISBN: 978-0-387-71754-8
Verlag: Springer-Verlag
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.
Autoren/Hrsg.
Weitere Infos & Material
1;Preface;6
2;Contents;10
3;1 Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features;14
4;2 Position-Binary Technology of Monitoring Defect at Its Origin;36
5;3 Technology of Digital Analysis of Noise as a Carrier of Information About the Beginning of a Defect’s Origin;55
6;4 Robust Correlation Monitoring of a Defect at Its Origin;94
7;5 Spectral Monitoring of a Defect’s Origin;123
8;6 The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier;144
9;7 The Technology of Monitoring a Defect’s Origin by Considering Noise as a Data Carrier;171
10;References;225
