Bagatin / Gerardin Ionizing Radiation Effects in Electronics

From Memories to Imagers
Erscheinungsjahr 2015
ISBN: 978-1-4987-2263-6
Verlag: CRC Press
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 412 Seiten

Reihe: Devices, Circuits, and Systems

This book provides a wide perspective on the effects of ionizing radiation in modern semiconductor devices, addressing a wide range of electronic devices and several environments of interest: terrestrial, space, and high-energy physics experiments. It introduces radiation effects and the underlying basic mechanisms. It provides real examples and case studies to assess radiation effects issues in a wide range of electronic devices.

Autoren/Hrsg.

Bagatin, Marta

Gerardin, Simone

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Maschinenbau
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Medizin | Veterinärmedizin Medizin | Public Health | Pharmazie | Zahnmedizin Medizin, Gesundheitswesen Medizintechnik, Biomedizintechnik, Medizinische Werkstoffe
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Medizintechnik, Biomedizintechnik

Inhaltsverzeichnis

Introduction to ionizing radiation effects. Monte Carlo Simulations of Radiation Effects. Real-Time Soft-Error Rate Characterization of Advanced SRAMs. Multiple upsets in SRAMs processed in decananometric CMOS technologies. Radiation Effects in DRAM. Radiation Effects in Flash Memories. Radiation Effects in Microprocessors in Space
. RHBD flip-flops, timing and physical design. Fault Tolerance Techniques and Reliability Modeling for SRAM-based FPGAs. Assuring Robust Triple-Modular. Redundancy Protected Circuits in SRAM-based FPGAs. Radiation Effects in Modern CMOS Image Sensors. Radiation Effects in CCDs. Radiation Effects in Fiber Optics. Radiation Effects in Analog/Mixed Signal and RHBD. Radiation effects in read-out electronics for pixel detectors.