Bhushan / Fuchs / Tomitori Applied Scanning Probe Methods VIII
2008
ISBN: 978-3-540-74080-3
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Scanning Probe Microscopy Techniques
E-Book, Englisch, 465 Seiten, eBook
Reihe: NanoScience and Technology
ISBN: 978-3-540-74080-3
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
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Professional/practitioner
Autoren/Hrsg.
Weitere Infos & Material
P.G. Gucciardi, G. Bachelier, S.J. Stranick, and M. Allegrini: Background-free apertureless near-field imaging.- Hao-Chih (Bernard) Liu, Gregory A. Dahlen, Jason R. Osborne: Critical Dimension Atomic Force Microscopy for Sub-50 nm Microelectronics Technology Nodes.-
E. Cefalì, S. Patanè, S. Spadaro, R. Gardelli, M. Albani, M. Allegrini: Near Field Probes: from optical fibers to optical nanoantennas.- Sophie Marsaudon, Charlotte Bernard, Dirk Dietzel, Cattien V. Nguyen, Anne-Marie Bonnot, Jean-Pierre Aime, Rodolphe Boisgard: Carbon Nanotubes as SPM Tips: Nanotube Tips Mechanical Properties and Imaging.- H.D. Espinosa and Andrea Ho: Scanning Probes for the Life Sciences.- Hayato Sone and Sumio Hosaka: Self-sensing cantilever sensor for bio-science.- Vinzenz Friedli, Samuel Hoffmann, Johann Michler, and Ivo Utke: AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication.- Peter J. Cumpson, Charles Clifford, Jose Portoles, James Johnstone, and Martin Munz: Cantilever Spring Constant Calibration in Atomic Force Microscopy.- Suzanne P. Jarvis, John E. Sader, Takeshi Fukuma: Frequency Modulation Atomic Force Microscopy in Liquids.- Y. Rosenwaks, O. Tal, S. Saraf, A. Schwarzman, E. Lepkifker, and A. Boag: Kelvin Probe Force Microscopy: Recent Advances and Applications.- Stefan Lanyi: Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale.- Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari and Gabriel Gomila: Probing Electrical transport properties at the nanoscale by current-sensing Atomic Force Microscopy.-
