Buch, Englisch, 476 Seiten, HC runder Rücken kaschiert, Format (B × H): 160 mm x 241 mm, Gewicht: 1002 g
Reihe: NanoScience and Technology
Buch, Englisch, 476 Seiten, HC runder Rücken kaschiert, Format (B × H): 160 mm x 241 mm, Gewicht: 1002 g
Reihe: NanoScience and Technology
ISBN: 978-3-540-00527-8
Verlag: Springer Berlin Heidelberg
Zielgruppe
Professional/practitioner
Autoren/Hrsg.
Fachgebiete
- Naturwissenschaften Chemie Physikalische Chemie
- Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
- Technische Wissenschaften Technik Allgemein Nanotechnologie
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
- Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
- Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
Weitere Infos & Material
Part I: Scanning Probe Microscopy.- A. Schirmeisen, B. Ancykowski, H. Fuchs: Dynamic Force Microscopy. J.E. Houston: Interfacial Force Microscopy: Selected Applications. Volker Scherer, Michael Reinstaedtler, Walter Arnold: Atomic Force Microscopy with Lateral Modulation. E.Oesterschulze, R. Kassing: Sensor Technology for Scanning Probe Microscopy. J.S. Villarrubia: Tip Characterization for Dimensional Nanometrology.- Part II: Characterization.- Bharat Bhushan: Micro/Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopy. Sergei Magonov: Visualization of Polymer Structures with Atomic Force Microscopy. Juergen Keller, Dietmar Vogel, Andreas Schubert, and Bernd Michel: Displacement and Strain Field Measurements from SPM Images. Ndubuisi G. Orji, Martha I. Sanchez, Jay Raja, and Theodore V. Vorburger: AFM Characterization of Semiconductor Line Edge Roughness. Redhouane Henda: Mechanical Properties of the Self-Assembled Organic Monolayers: Experimental Techniques and Modeling Approaches. LiShi and Arun Majumdar: Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy. Gustavo Luengo, Frederic Leroy: The Science of Beauty at Small Scale. Applications of Scanning Probe Methods on Cosmetic Science.- Part III: Industrial Applications.- S. Hosaka: SPM Based Storage Using Atomic Manipulation and Surface Modification. J. Tominaga: Super Density Optical Data Storage by Near-Field Optics. R. Yamamoto, K. Sanada, S. Umemura. R: Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM). K. Matsumoto: Room-Temperature Single Electron Devices Formed ba AFM Nano-Oxidation Process.