E-Book, Englisch, Band 7, 213 Seiten, eBook
Bonani / Ghione Noise in Semiconductor Devices
2001
ISBN: 978-3-662-04530-5
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Modeling and Simulation
E-Book, Englisch, Band 7, 213 Seiten, eBook
Reihe: Springer Series in Advanced Microelectronics
ISBN: 978-3-662-04530-5
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
1. Noise in Semiconductor Devices.- 2. Noise Analysis Techniques.- 3. Physics-Based Small-Signal Noise Simulation.- 4. Results and Case Studies.- 5. Noise in Large-Signal Operation.- A. Appendix: Review of Probability Theory and Random Processes.- A.1 Fundamentals of Probability Theory.- A.2 Random Processes.- A.3 Correlation Spectra and Generalized Harmonic Analysis of Stochastic Processes.- A.4 Linear Transformations of Stochastic Processes.- A.5 Cyclostationary Stochastic Processes.- A.6 A Glimpse of Markov Stochastic Processes.- References.
