Chen Mapping Nanotechnology Innovations and Knowledge
1. Auflage 2008
ISBN: 978-0-387-71620-6
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
Global and Longitudinal Patent and Literature Analysis
E-Book, Englisch, 330 Seiten, Web PDF
Reihe: Engineering
ISBN: 978-0-387-71620-6
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
This book defines the application of Information Technology’s systematic and automated knowledge mapping methodology to collect, analyze and report nanotechnology research on a global basis. It offers a systematic presentation of the state-of-the-art of nanotechnology. Coverage includes basic analysis, content analysis, and citation network analysis of comprehensive nanotechnology findings across technology domains, inventors, institutions, and countries. The book explores many sources in detail including, the nanotechnology patent and literature databases from the US patent Office (USPTO), the European Patent Office (EPO), and the Japanese Patent Office (JPO).
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Nanotechnology: An Emerging Field.- Knowledge Mapping: Foundation.- Knowledge Mapping: Analysis Framework.- Mapping Nanotechnology Innovations Via USPTO Database: A Longitudinal Study, 1976-2002..- Federal Funding and Nanotechnology Innovations: NSF Funding and USPTO Patent Analysis, 1991-2002..- Topological Analysis of Patent Citation Networks: Nanotechnology at USPTO, 1976-2004.- Government Research Investment and Nanotechnology Innovations: NSF Funding and USPTO Patent Analysis, 2001-2004..- Academic Literature Citation in Patents: A Longitudinal Study of USPTO Patents, 1976-2004..- Worldwide Nanotechnology Development: A Comparative Study of USPTO, EPO, and JPO Patents, 1976-2004..- Mapping Nanotechnology Knowledge Via Literature Database: A Longitudinal Study, 1976-2004.- The NanoMapper System: Accessing and Visualizing Nanotechnology Patents and Grants.




