Delhez / Mittemeijer European Powder Diffraction EPDIC 1

Erscheinungsjahr 1991
ISBN: 978-3-0357-0462-4
Verlag: Trans Tech Publications
Format: PDF
Kopierschutz: 0 - No protection

E-Book, Englisch, 1020 Seiten

Materials Science Forum Vols. 79-82

Autoren/Hrsg.

Delhez, R.

Mittemeijer, E.J.

Inhaltsverzeichnis

Preface
The Role of Munich in X-Ray Crystallography and the Development of Powder Diffraction
Indexing of Powder Diffraction Patterns
Quo Vadis Quantitative Powder Diffraction Phase Analysis
Automated Multicomponent Phase Identification using Fuzzy Sets and Inverted Data Base Search
XRD as a Tool in Phase-Diagram Imaging
Ambiguities in the Interpretation of Powder Patterns
Detectability of Phases in Protective Magnetite Thin Film Samples
Depth Distribution of Phase Content Reconstruction in Thin Films X-Ray Diffractometry
Quantitative Phase Analysis of Textured Materials
X-Ray Diffraction Line Profiles due to Real Polycrystals
Quality of Unravelling of Experimental Diffraction Patterns with Artificially Varied Overlap
PC-Profile Analysis of Peak Clusters in Angle and Energy Dispersive Powder Diffractometry
Desummation of Mixed Powder Diffraction Lines
A Method for Data Reduction and Optimal Experimental Design in XPD
The Method of Synthesizing the Function of the Diffraction Maximum Shape. The Possibility of Applying it for Structural Refinement
A Correction for Truncation of Powder Diffraction Line Profiles
Comparison of Single- and Multiple-Peak Methods for the Determination of Crystallite Size and Lattice Strain using Pseudo-Voigt Functions
X-Ray Powder Diffraction Data Reduction by Integrating the Wilson and the Warren-Averbach Theories
Simulation of Diffraction Patterns from Small Bimetallic Crystals with Concentration Gradient
X-Ray Stress Analysis
Influence of PSI- and OMEGA-Tilting on X-Ray Stress Analysis
Non-Destructive Stress Measurement with Depth Resolution
Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction
Preferred Orientation in Powder Diffraction
Texture Analysis of Multi-Phase Materials by Neutron Diffraction
Extinction in Texture Analysis
Method of Scanning of Reciprocal Space of Axial Textures and its Applications to Structural Investigations
On the Use of Rietveld Refinements for Structural Studies
The Two-Step-Method and its Applications in Crystallographic Problems
Sign Determination from Powder Diffraction Data of CuSo4 · 5H2O
Fourier Maps Obtained from Powder Diffraction Data - Applications Beyond Pure Illustration
Influence of Crystallite Size and Microstain on Structure Refinement
Crystal Size Dependent Anisotropic Line Broadening in Rietveld X-Ray Analysis
A Theta-Dependent Error Present in Powder Data of Highly Absorbing Materials: A Surface Roughness Effect?
Qualitative XRPD Analysis System
Qualitative X-Ray Phase Analysis on the Basis of the Calculated Standards
Program Package COMPHYS for IBM PC
Solution of Nontraditional Problems Based upon PDF-2
Database for Qualitative X-Ray Diffraction Phase Analysis of Natural Materials
GUFI-WYRIET: An Integrated PC Powder Pattern Analysis Package
MRIA - A Program for a Full Profile Analysis of Powder Neutron-Diffraction Time-of-Flight (Direct and Fourier) Spectra
Numerical Refinement of Lattie Parameters: Monoclinic Case
Thermal Coefficient of Expansion (TCE)-Program for Calculation of TCE's for Single Crystals of all Systems
Database for the Structural Problems of High Temperature Superconductors
PULPLOT - A PC Routine for the Graphic Representation and Superimposition of X-Ray Powder Diffraction Patterns
New Instrumentation in Powder Diffraction
A Powder Diffractometer for Large-Sized Specimens
The Quantitative Powder Diffractometer, QPD
Imaging the Focus of a Microfocus X-Ray Source with Zone Plates
Fluid Cooled Rotating Anode Without Mechanical Feedthrough of the Anode Axis to the Vacuum
Diffractometer with a Curved PSD for Analysis of Polycrystalline Microsamples
X-Ray Diffractometric Sensors in Commercial Production
New Detectors in X-Ray Diffraction
Highly Stable Position-Sensitive Detectors for Powder Diffractometry
The INEL X-Ray Position Sensitive Detector: A Study of D-Spacing Accuracy and Exposure Time
A Two-Dimensional CCD-Based Detector for X-Ray Radiation
Analyser and P.S.D.: Energy Resolution Improvement
Physical Principles of X-Ray Storage Phosphors
Silicon Pin Photodiodes as Detectors with High Dynamical Range for X-Rays
A High Resolution Gas Electroluminescent Detector for X-Ray Structure Analysis
The Application of a Proportional-Scintillation-Detector in X-Ray Diffractometry
Autoradiographic Image Enhancement of Debye-Scherrer Patterns
Energy Dispersive XRPD at High Pressure
X-Ray Diffractometer for High Pressure and Low Temperatures
First Experiments with a Newly Developed High-Pressure/High-Temperature Cell for Neutron Powder Diffraction
Low- and High-Temperature Accessories for the D500 Powder Diffractometer
A New Attachment for Non-Ambient X-Ray Powder Diffraction Studies in Various Atmospheres
A Furnace for X-Ray Powder Diffraction with Synchrotron Radiation
Powder Diffraction using Synchrotron Radiation
The Use of Debye Scherrer Geometry for High Resolution Powder Diffraction
A New Beauty for Adone: A High Resolution Powder Diffractometer for Synchrotron Radiation Experiments
Depth Profiling in Thin Films by Grazing Incidence Diffraction using Synchrotron Radiation
A New High Resolution Neutron Powder Diffractometer at the Brookhaven High Flux Beam Reactor
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