E-Book, Englisch, Band Volume 4, 392 Seiten, Web PDF
Einspruch VLSI Electronics
1. Auflage 2014
ISBN: 978-1-4832-1771-0
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark
Microstructure Science
E-Book, Englisch, Band Volume 4, 392 Seiten, Web PDF
Reihe: VLSI Electronics Microstructure Science
ISBN: 978-1-4832-1771-0
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark
VLSI Electronics: Microstructure Science, Volume 4 reviews trends for the future of very large scale integration (VLSI) electronics and the scientific base that supports its development. This book discusses the silicon-on-insulator for VLSI and VHSIC, X-ray lithography, and transient response of electron transport in GaAs using the Monte Carlo method. The technology and manufacturing of high-density magnetic-bubble memories, metallic superlattices, challenge of education for VLSI, and impact of VLSI on medical signal processing are also elaborated. This text likewise covers the impact of VLSI technology on the design of intelligent measurement instruments and systems. This volume is valuable to scientists and engineers who wish to become familiar with VLSI electronics, device designers concerned with the fundamental character of and limitations to device performance, systems architects who will be charged with tying VLSI circuits together, and engineers conducting work on the utilization of VLSI circuits in specific areas of application.
Autoren/Hrsg.
Weitere Infos & Material
1;Front Cover;1
2;VLSI Electronics Microstructure Science;4
3;Copyright Page;5
4;Table of Contents;8
5;Dedication;6
6;List of Contributors;12
7;Preface;14
8;Chapter 1. Silicon-on-Insulator for VLSI and VHSIC;16
8.1;I. Introduction;16
8.2;II. Application of SOl to VLSI/VHSI Circuits;22
8.3;III. The Various SOl Technologies;39
8.4;IV. Conclusions;61
8.5;References;65
9;Chapter 2. X-Ray Lithography;70
9.1;I. Introduction;71
9.2;II. Spectral Region of Interest;74
9.3;III. X-Ray Proximity Printing;75
9.4;IV. Sources;77
9.5;V. Masks;86
9.6;VI. Resists;90
9.7;VII. Mask Alignment;97
9.8;VIII. Exposure Systems;102
9.9;IX. Applications;104
9.10;X. Conclusion;108
9.11;References;109
10;Chapter 3. Transient Response of Electron Transport in GaAs Using the Monte Carlo Method;114
10.1;I. Introduction;114
10.2;II. Monte Carlo Method;117
10.3;III. Transient Response Calculations;120
10.4;IV. Conclusion;159
10.5;References;159
11;Chapter 4. Technology and Manufacturing of High-Density Magnetic-Bubble Memories;162
11.1;I. Introduction;162
11.2;II. Critical Developments Necessary for High-Density Bubble Technology;163
11.3;III. Magnetic-Bubble Technology;166
11.4;IV. Magnetic-Bubble Memory Manufacturing;177
11.5;V. Future Trends in Bubble Devices;191
11.6;VI. Summary;194
11.7;References;195
12;Chapter 5. Metallic Superlattices;198
12.1;I. Introduction;198
12.2;II. Preparation Techniques;199
12.3;III. Structural and Physical Properties;205
12.4;IV. Summary;217
12.5;References;218
13;Chapter 6. The Challenge of Education for VLSI;222
13.1;I.
The Situation;222
13.2;II. The Solutions;226
13.3;III.
Conclusion;232
13.4;References;233
14;Chapter 7. The Impact of VLSI on Medical Signal Processing;234
14.1;I. Introduction;234
14.2;II. Biological Signals;236
14.3;III. Methodologies for Computer Analysis of Biological Signals;239
14.4;IV. Implementation of Signal-Analysis Systems on VLSI Devices;246
14.5;V. Future Development of VLSI for Dedicated Signal Processing;252
14.6;References;254
15;Chapter 8. The Effect of VLSI: Prospects for the Office of the Future;258
15.1;I. VLSI and Office Work;258
15.2;II. Mechanization of the Office;265
15.3;III. Office of the Future: Convergence of Need and Technology;283
15.4;References;296
16;Chapter 9. The Impact of VLSI Technology on the Design of Intelligent Measurement Instruments and Systems;298
16.1;I. Introduction;299
16.2;II. General Observations on Functional Building Blocks and Instrument Architecture;310
16.3;III. Ease of Operating an Instrument;324
16.4;IV. Taking Advantage of VLSI Technology in Accuracy;325
16.5;V. Testability Considerations;326
16.6;VI. Conclusions Regarding the Impact of VLSI Technology on Electronic Instrument and System Design;331
16.7;References;332
17;Chapter 10. Impact of VLSI on Pattern Recognition and Image Processing;334
17.1;I. Introduction;334
17.2;II. Digital Image Processing and Recognition;336
17.3;III. VLSI Architecture for Image Filtering and Segmentation;347
17.4;IV. LSI/VLSI Image-Processing and Pattern-Recognition Systems;358
17.5;V. Conclusions;372
17.6;References;373
18;Index;376
19;Contents of Other Volumes;390




