Françon / Alexander / Bacq Progress in Microscopy

International Series of Monographs on Pure and Applied Biology: Modern Trends in Physiological Sciences
1. Auflage 2013
ISBN: 978-1-4831-8459-3
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 306 Seiten, Web PDF

Progress in Microscopy details the advancement in various areas of microscopy. The title covers the phenomena, techniques, measurements, and equations. The text first details the physical aspects of image formation in microscopy, and then proceeds to tackling phase contrast, interference, and reflected-light microscopy. Next, the selection deals with the geometrical measurements and the measurement of refraction indices, thickness, and slope. The text also covers infra-red and ultra-violet microscopy, microspectroscopy, microspectrophotometry, and chemical microscopy. The book will be of great use to physicists who specializes in optics.

Autoren/Hrsg.

Françon, M.

Alexander, P.

Bacq, Z. M.

Inhaltsverzeichnis

1;Font Cover;1
2;Progress in Microscopy;4
3;Copyright Page;5
4;Table of Contents;6
5;Foreword;10
6;CHAPTER I. Physical Aspects of Image Formation in Microscopy;12
6.1;1. INTRODUCTION;12
6.2;2. IMAGE OF A LUMINOUS POINT EXHIBITED BY THE OBJECTIVE OF A MICROSCOPE IN MONOCHROMATIC LIGHT;13
6.3;3. IMAGE OF A LUMINOUS POINT ORIGINATED BY A REFLECTING OBJECTIVE;19
6.4;4. IMAGE OF A LUMINOUS POINT WHEN THE MICROSCOPE IS NOT PROPERLY FOCUSED (MONOCHROMATIC LIGHT);20
6.5;5. IMAGE OF A LUMINOUS POINT IN WHITE LIGHT;25
6.6;6. LUMINOUS POINT IMAGED IN THE PRESENCE OF ABERRATIONS;30
6.7;7. OBJECTS IN COHERENT, INCOHERENT AND PARTIALLY COHERENT ILLUMINATION;35
6.8;8. EXTENDED OBJECTS IMAGED IN INCOHERENT ILLUMINATION;42
6.9;9. EXTENDED OBJECTS IMAGED IN COHERENT AND PARTIALLY COHERENT ILLUMINATION;50
6.10;10. PERCEPTION LIMIT AND RESOLVING POWER;59
6.11;11. STRAY LIGHT;70
6.12;12. REDUCING THE GRAIN OF PHOTOGRAPHIC IMAGES;72
7;CHAPTER II. Phase Contrast Microscopy;75
7.1;1. TRANSPARENT OBJECTS;75
7.2;2. PRINCIPLE OF THE PHASE-CONTRAST METHOD;75
7.3;3. CONTRAST AND SENSITIVENESS OF THE METHOD;82
7.4;4. IMAGE STRUCTURE IN PHASE-CONTRAST;84
7.5;5. PERCEPTION LIMIT AND RESOLVING POWER. EFFECTS OF STRAY LIGHT;86
7.6;6. PHASE-CONTRAST MICROSCOPES IN TRANSMITTED LIGHT;87
7.7;7. PHASE-CONTRAST APPLICATIONS;101
8;CHAPTER III. Interference Microscopy in Transmitted Light;105
8.1;1. OBJECT AND FUNDAMENTALS OF INTERFERENCE MICROSCOPY;105
8.2;2. FUNDAMENTALS OF TWO-WAVE INTERFERENCE MICROSCOPES;105
8.3;3. DYSON'S INTERFERENCE MICROSCOPE;108
8.4;4. LEITZ'S INTERFERENCE MICROSCOPE;112
8.5;5. POLARIZATION INTERFERENCE MICROSCOPES;114
8.6;6. THEORETICAL PRINCIPLE OF POLARIZING INTERFERENCE MICROSCOPES;115
8.7;7. SMITH'S FULL IMAGE DUPLICATION INTERFERENCE MICROSCOPE;121
8.8;8. FRANÇON'S COMPENSATED INTERFERENCE EYEPIECE;124
8.9;9. L. P. JOHANSSON'S INTERFEROMETER EYEPIECE;128
8.10;10. NOMARSKI'S INTERFERENCE MICROSCOPE;129
8.11;11. AXIAL IMAGE DUPLICATION INTERFERENCE MICROSCOPES;131
8.12;12. MULTI-WAVE INTERFERENCE MICROSCOPES;133
8.13;13. MENZEL'S INTERFERENCE MICROSCOPE;138
8.14;14. SENSITIVITY OF INTERFERENCE MICROSCOPES;139
9;CHAPTER IV. Reflected-light Microscopy;140
9.1;1. METHODS APPLIED IN REFLECTED-LIGHT MICROSCOPY;140
9.2;2. REFLECTED-LIGHT PHASE-CONTRAST;144
9.3;4. REFLECTED-LIGHT INTERFERENCE MICROSCOPES;151
9.4;5. OBSERVATION IN POLARIZED LIGHT;167
9.5;6. SCRUTINIZING OF HOT-METAL SURFACES;170
10;CHAPTER V. Geometrical Measurements;172
10.1;1. SETTINGS IN MICROSCOPY;172
10.2;2. SETTING ACCURACY;172
10.3;3. MEASURING A LENGTH IN A FOCUSING PLANE BY MEANS OF TWO TRANSVERSE SETTINGS;176
10.4;4. MEASURING A THIN OBJECT BY TWO AXIAL SETTINGS;177
10.5;5. MEASURING A LENGTH WHOSE ENDS DO NOT LIE IN THE SAME FOCUSING PLANE;177
10.6;6. MEASURING SMALL AREAS AND VOLUMES;178
10.7;7. DETERMINING THE NORMAL IN A POINT OF A SMALL REFLECTING SURFACE;178
10.8;8. HIGH PRECISION-MEASUREMENT MICROSCOPES;181
11;CHAPTER VI. Measuring Refraction Indices of Transparent Objects: Unpolarized Two-wave Interference Microscopes;183
11.1;1. MEASURING PATH DIFFERENCES;183
11.2;2. DETERMINING THE REFRACTION INDEX FROM PATH DIFFERENCE MEASUREMENT;188
12;CHAPTER VII. Measuring Refraction Indices of Transparent Objects: Polarizing Interference Microscopes;190
12.1;APPLICATION OF THE FULL-DUPLICATION METHOD;190
12.1.1;1. MEASURING PATH DIFFERENCES BY MEANS OF THE FLAT-TINTS PROCESS. FULL-DUPLICATION PROCESS;190
12.1.2;2. MEASURING PATH DIFFERENCES, APPLYING THE FRINGES PROCESS (FULL-DUPLICATION PROCESS);196
12.1.3;3. DETERMINING THE REFRACTION INDEX FROM PATH-DIFFERENCE MEASUREMENT (FULL-DUPLICATION PROCESS);204
12.1.4;4. MEASURING THE REFRACTION INDEX OF LIQUIDS (FULL-DUPLICATION PROCESS);206
12.2;APPLICATION OF THE DIFFERENTIAL METHOD;208
12.2.1;5. MEASURING PATH DIFFERENCE USING THE FLAT-TINTS METHOD (DIFFERENTIAL PROCESS);208
12.2.2;6. FRINGE-SHIFT PATH-DIFFERENCE MEASUREMENTS (DIFFERENTIAL PROCESS);212
12.2.3;7. DETERMINING THE REFRACTION INDEX FROM PATH-DIFFERENCE MEASUREMENTS;214
12.2.4;8. MEASURING THE REFRACTION INDEX OF LIQUIDS (DIFFERENTIAL PROCESS);215
12.2.5;9. MEASURING BIREFRINGENCE THROUGH A POLARIZING INTERFERENCE MICROSCOPE;219
12.2.6;10. CONCLUSION;219
13;CHAPTER VIII. Measuring Thickness and Slopes with Interference Microscopes· Measuring Dry Masses;221
13.1;1. TRANSPARENT OBJECTS;221
13.2;2. REFLECTIVE OBJECTS (THICKNESS MEASUREMENT);222
13.3;3. MEASURING ANGLES OF CONTACT BETWEEN LIQUID AND SOLID SURFACES;231
13.4;4. MEASURING DRY MASSES BY MEANS OF AN INTERFERENCE MICROSCOPE;235
14;CHAPTER IX. Infra-red and Ultra-violet Microscopy;237
14.1;1. MICROSCOPE OBJECTIVES IN INFRA-RED AND ULTRA-VIOLET MICROSCOPES;237
14.2;2. OBSERVING AND RECORDING INFRA-RED AND ULTRA-VIOLET IMAGERY;245
14.3;3. FLUORESCENCE;248
15;CHAPTER X. Microspectroscopy and Microspectrophotometry;251
15.1;1. FUNDAMENTALS OF MICROSPECTROSCOPY AND MICROSPECTROPHOTOMETRY;251
15.2;2. THE OBJECT IS ILLUMINATED IN MONOCHROMATIC LIGHT;252
15.3;3. THE OBJECT IS ILLUMINATED IN WHITE LIGHT;263
15.4;4. MICROSPECTROPHOTOMETRIC MEASUREMENTS;264
15.5;5. CAUSES OF ERRORS IN MICROSPECTROPHOTOMETRY;267
15.6;6. PHOTOMETRIC EYEPIECES;269
15.7;7. FLUORESCENCE MICROSPECTROPHOTOMETRY;272
16;CHAPTER XI. Chemical Microscopy;276
16.1;1. INTRODUCTION;276
16.2;2. HOT STAGE AND COLD STAGE;276
16.3;3. CALIBRATING THE HOT STAGE;279
16.4;4. DETERMINING THE MELTLNG POINT;280
16.5;5. MEASURING THE REFRACTION INDEX OF A MELTED SUBSTANCE;282
16.6;6. MIXED FUSION — KÖFLER'S CONTACT METHOD;283
16.7;8. APPLICATION OF FUSION METHODS;287
16.8;9. CHARACTERIZING AND IDENTIFYING FUSIBLE COMPOUNDS;289
17;SHORT BIBLIOGRAPHY;290
18;INDEX;294