Fultz / Howe Transmission Electron Microscopy and Diffractometry of Materials
3rd Auflage 2008
ISBN: 978-3-540-73886-2
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
E-Book, Englisch, 778 Seiten, Web PDF
Reihe: Chemistry and Material Science (R0)
ISBN: 978-3-540-73886-2
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Diffraction and the X-Ray Powder Diffractometer.- The TEM and its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.
