E-Book, Englisch, 396 Seiten
Gevorgian Ferroelectrics in Microwave Devices, Circuits and Systems
1. Auflage 2009
ISBN: 978-1-84882-507-9
Verlag: Springer-Verlag
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
Physics, Modeling, Fabrication and Measurements
E-Book, Englisch, 396 Seiten
ISBN: 978-1-84882-507-9
Verlag: Springer-Verlag
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
Autoren/Hrsg.
Weitere Infos & Material
1;Preface;7
2;Contents;10
3;Abbreviations;16
4;Chapter 1 Introduction: Overview of Agile Microwave Technologies;19
4.1;1.1 Introduction;19
4.2;1.2 Ferroelectrics: The Main Material Properties;20
4.3;1.3 Microwave Applications;25
4.4;1.4 Other Agile Microwave Technologies;33
4.5;1.5 Conclusions;36
4.6;References;36
5;Chapter 2 Physics of the Tunable Ferroelectric Devices;38
5.1;2.1 Introduction;38
5.2;2.2 Crystal Structure, Non-Polar (Paraelectric) and Polar (Ferroelectric) Phases;39
5.3;2.3 Dielectric Models of the Ferroelectric and Paraelectric Phases;41
5.4;2.4 Engineering Models of the Dielectric Permittivity;46
5.5;2.5 Models of the Loss Tangent;54
5.6;2.6 Dielectric Nonlinearities;61
5.7;2.7 Thin Films vs. Bulk;63
5.8;2.8 Electro-Acoustic Properties;69
5.9;2.9 Bulk Conductivity;73
5.10;2.10 Conclusions;74
5.11;References;74
6;Chapter 3 Fabrication of Ferroelectric Components and Devices;77
6.1;3.1 Introduction;77
6.2;3.2 Fabrication of Devices Using Single Crystals;79
6.3;3.3 Fabrication of Devices Using Bulk Ceramics;84
6.4;3.4 Thick Film, HTCC and LTCC Technologies;90
6.5;3.5 Fabrication of Thin Ferroelectric Films;96
6.6;3.6 Thin Film Device Processing;114
6.7;3.7 Substrate Micromachining and Passivation;122
6.8;3.8 Conclusions;124
6.9;References;125
7;Chapter 4 Substrates, Varactors and Passive Components;130
7.1;4.1 Introduction;130
7.2;4.2 Substrates;131
7.3;4.3 Varactors. Basic Designs and Figure of Merit;140
7.4;4.4 Equivalent Circuit Model of the Varactors;154
7.5;4.5 Low Frequency and Tuning Performances;159
7.6;4.6 Microwave Performance;166
7.7;4.7 Power Handling Capability and High Power Varactors;177
7.8;4.8 Ferroelectrics in Passive Devices as High Permittivity Dielectric;180
7.9;4.9 Conclusions;184
7.10;References;185
8;Chapter 5 Ferroelectric Devices;189
8.1;5.1 Introduction;189
8.2;5.2 Tunable Delay Lines and Delay Line Type Phase Shifters;190
8.3;5.3 Phase Shifters;201
8.4;5.4 Tunable Filters;210
8.5;5.5 Matching Networks (Impedance Tuners);218
8.6;5.6 Power Splitters;220
8.7;5.7 Antennas;221
8.8;5.8 Nonlinear Devices;222
8.9;5.9 TFBARs;226
8.10;5.10 Conclusions;231
8.11;References;231
9;Chapter 6 Circuit and System Applications of Tunable Ferroelectric Devices;238
9.1;6.1 Introduction;238
9.2;6.2 Voltage Controlled Oscillators;239
9.3;6.3 Amplifiers;242
9.4;6.4 Steerable Phased Array and Beam Antennas;244
9.5;References;255
10;Chapter 7 Modeling;257
10.1;7.1 Introduction;257
10.2;7.2 Coplanar-Plate Transmission Lines;258
10.3;7.3 Multilayer Substrate Coplanar-Plate Capacitors;272
10.4;7.4 Parallel-Plate Capacitor;279
10.5;7.5 Conclusions;283
10.6;Appendix A;285
10.7;Appendix B;288
10.8;Appendix C;292
10.9;Appendix D;297
10.10;References;297
11;Chapter 8 Measurements of the Dielectric Properties;299
11.1;8.1 Introduction;299
11.2;8.2 Resonant Techniques;301
11.3;8.3 Broadband Techniques;329
11.4;8.4 Nonlinear Measurements of Ferroelectrics;342
11.5;8.5 Switching Time of Ferroelectric Films;344
11.6;8.6 Conclusions;346
11.7;Appendix E;348
11.8;Appendix F;355
11.9;Appendix G;358
11.10;References;359
12;Chapter 9 Potentials and Perspectives;362
12.1;9.1 Introduction;362
12.2;9.2 Multiferroics;363
12.3;9.3 Ferroelectric Nanotubes. Ferromagnetic Nanowires;365
12.4;9.4 Metamaterials;368
12.5;9.5 Bridging the “THz Gap”;371
12.6;9.6 Other Tunable Materials;372
12.7;9.7 Other/New Effects;381
12.8;9.8 Conclusions;384
12.9;References;385
13;Chapter 10 Concluding Remarks;390
13.1;10.1 Introduction;390
13.2;10.2 Stabilization of the Temperature Dependences;390
13.3;10.3 Nonlinearity and Power Handling Capability;395
13.4;10.4 Hysteresis, Retention, Long Term Stability and Noise;395
13.5;10.5 Reliability;398
13.6;10.6 Integration Trends;399
13.7;References;400
14;Index;402




