Dimensional Metrology

1. Auflage 2025
ISBN: 978-0-367-42092-5
Verlag: CRC Press

Buch, Englisch, 346 Seiten, Format (B × H): 157 mm x 235 mm, Gewicht: 655 g

This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists and researchers.

Dimensional Metrology presents and explains mathematical principles and treatments and practical applications of metrology, with numerous chapter exercises that link theory to the solution of practical problems. Computer-based classes of dimensional metrology are covered, such as CMM-technology, areal surface measurement and X-ray computed tomography. Readers are shown how to perform and evaluate dimensional measurements and interpret the results. Measuring instruments and methods are explained so that readers can determine which one to use for specific applications.

This book aims to give both technicians and academic researchers in the field a thorough understanding of both the mathematical principles and uses and their applications. It can well act as the basis for a course series at the bachelor’s and master’s level for students in mechanical engineering.

Zielgruppe

Postgraduate

Autoren/Hrsg.

Haitjema, Han

Leach, Richard

Fachgebiete

• Technische Wissenschaften Technik Allgemein Industrial Engineering
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Maschinenbau
• Technische Wissenschaften Bauingenieurwesen Bauingenieurwesen
• Geisteswissenschaften Design Produktdesign, Industriedesign

Inhaltsverzeichnis

1. Basic Concepts. 2. General Principles of Dimensional Metrology. 3. Measurement Uncertainty. 4. Interferometry. 5. Sensor Principles. 6. Material Dimensional and Angle Measures. 7. Dimensional Measurement Equipment and Measurands. 8. Coordinate Measurements. 9. Surface Topography Filtering and Characterization.

Über Autor(innen)

Han Haitjema is Emeritus Professor at the KU Leuven, Belgium, and a metrologist at Mitutoyo Europe. Prior to these positions, he was the director of the Mitutoyo Research Center Europe, an assistant professor at the TU-Eindhoven in the Precision Engineering group of Professor Schellekens and a scientist covering dimensional metrology at the VSL, the National Metrology Institute of the Netherlands. He loves dimensional metrology in all its aspects, from fundamental physics to quality control, and the application of mathematical and basic principles to new and existing calibration methods. He is a fellow of the CIRP, a member of the board of experts for the Dutch national standards and the editor-in-chief of the journal Metrology.

Richard Leach is Professor of Metrology at the University of Nottingham and grew the Manufacturing Metrology Team. Prior to this position, he was at the National Physical Laboratory from 1990 to 2014. His primary love is instrument building, from concept to final installation, and his current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, development of methods for measuring 3D structures, uncertainty evaluation and theoretical methods to model optical instruments. During his career, he was a leader of several professional societies and a visiting professor at Loughborough University and the Harbin Institute of Technology. These days he is partially retired and focusing on an ERC advanced grant on using advanced mathematics and machine learning to increase optical instrument data processing.