Advances in Imaging and Electron Physics: Dirac's Difference Equation and the Physics of Finite Differences

Erscheinungsjahr 2008
ISBN: 978-0-12-374221-6
Verlag: ACADEMIC PR INC

Buch, Englisch, Band 154, 336 Seiten, Format (B × H): 157 mm x 226 mm, Gewicht: 635 g

Reihe: Advances in Imaging & Electron

In this volume, the authors extend the calculus of finite differences to Dirac's equation. They obtain solutions for particles with negative mass that are completely equivalent to the solutions with positive mass. In addition, they obtain solutions for nuclear distances of the order of 10-13m and less rather than for the usual atomic distances. They report a number of other deviations from the differential theory, for instance they found a slight deviation in the eigenvalues of an electron in a Coulomb field, similar to the Lamb shift. In two sections some surprising results are shown for the concept of space caused by the replacement of dx by delta x.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Harmuth, Henning

Meffert, Beate

Hawkes, Peter W.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik

Inhaltsverzeichnis

1. Introduction2. Modified Dirac Equation3. Inhomogeneous Dirac Difference Equation4. Dirac Difference Equation in Spherical Coordinates5. Inhomogeneous Equations for Coulomb Potential6. AppendixReferences and BibliographyIndex

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.