Buch, Englisch, Band 51, 98 Seiten, Format (B × H): 164 mm x 244 mm, Gewicht: 317 g
Buch, Englisch, Band 51, 98 Seiten, Format (B × H): 164 mm x 244 mm, Gewicht: 317 g
Reihe: Lecture Notes in Electrical Engineering
ISBN: 978-90-481-3442-7
Verlag: Springer
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.
