Krishnaswamy / Markov / Hayes Design, Analysis and Test of Logic Circuits Under Uncertainty

1. Auflage 2012
ISBN: 978-90-481-9644-9
Verlag: Springer Netherland
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 124 Seiten, Web PDF

Reihe: Lecture Notes in Electrical Engineering

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Zielgruppe

Research

Autoren/Hrsg.

Krishnaswamy, Smita

Markov, Igor L.

Hayes, John P.

Inhaltsverzeichnis

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.