Liu / Xu Trace-Based Post-Silicon Validation for VLSI Circuits

1. Auflage 2013
ISBN: 978-3-319-00533-1
Verlag: Springer International Publishing
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 108 Seiten

Reihe: Engineering (R0)

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

Zielgruppe

Research

Autoren/Hrsg.

Liu, Xiao

Xu, Qiang

Inhaltsverzeichnis

Introduction.- State of the Art on Post-Silicon Validation.- Signal Selection for Visibility Enhancement.- Multiplexed Tracing for Design Error.- Tracing for Electrical Error.- Reusing Test Access Mechanisms.- Interconnection Fabric for Flexible Tracing.- Interconnection Fabric for Systematic Tracing.- Conclusion.