Morita / Giessibl / Wiesendanger Noncontact Atomic Force Microscopy

Volume 2
1. Auflage 2009
ISBN: 978-3-642-01495-6
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 401 Seiten

Reihe: NanoScience and Technology

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Autoren/Hrsg.

Morita, Seizo

Giessibl, Franz J.

Wiesendanger, Roland

Inhaltsverzeichnis

1;Preface;6
2;Contents;8
3;List of Contributors;15
4;1 Introduction;19
4.1;1.1 Rapidly Developing High Performance AFM;19
4.1.1;1.1.1 Present Status of High Performance AFM;22
4.1.1.1;NC-AFM Spatial Resolution Beyond STM;22
4.1.1.2;Chemical Coordination Effect in NC-AFM Topographic Image;22
4.1.1.3;Mechanical Atom Manipulation Under Nearcontact Region;25
4.2;1.2 Future Prospects for High Performance AFM;26
4.2.1;1.2.1 Atomic and Molecular Imaging in Liquids;26
4.2.2;1.2.2 Magnetic Exchange Force Microscopy ;26
4.2.3;1.2.3 Rapid Growth of Tuning Fork/qPlus Sensor;29
4.2.4;1.2.4 Differentiation of Atomic Force;29
4.2.5;1.2.5 Atom-by-Atom Assembly of Complex Nanostructure at RT;30
4.3;References;31
5;2 Method for Precise Force Measurements;32
5.1;2.1 Quantitative Force Calculation;32
5.2;2.2 Thermal Drift;33
5.3;2.3 Three-Fold Feedback for Precise Tip–Sample Positioning;33
5.3.1;2.3.1 Principle of Atom-Tracking;34
5.3.2;2.3.2 Experimental Setup;35
5.3.3;2.3.3 Site-Specific Force Spectroscopy at Room Temperature;37
5.4;2.4 Thermal Drift Compensation for Force Field Mapping;40
5.4.1;2.4.1 Concept of Feedforward;40
5.4.2;2.4.2 Force Mapping at Room Temperature with Feedforward;41
5.4.3;2.4.3 Force Mapping with Feedforward;43
5.4.3.1;Example 1: Numerical Analysis for Potential and Lateral Force;43
5.4.3.2;Example 2: Surface Atom Discrimination;45
5.5;2.5 Summary;46
5.6;References;46
6;3 Force Spectroscopy on Semiconductor Surfaces;48
6.1;3.1 Introduction;48
6.2;3.2 Experimental Considerations;50
6.2.1;3.2.1 Extraction of the Short-Range Forcefrom the Frequency Shift;51
6.2.2;3.2.2 Determination of Relevant Acquisition Parameters;53
6.3;3.3 Energy Dissipation and Force Spectroscopy;55
6.3.1;3.3.1 Tip-Apex Characterization Combining Force Spectroscopy and First-Principles Calculations;55
6.3.2;3.3.2 Identification of an Energy Dissipation Channel;59
6.3.3;3.3.3 Surface Adhesion Maps at Atomic Scale;62
6.3.4;3.3.4 Signatures of Energy Dissipation in Frequency Shiftand Force Curves;63
6.4;3.4 Force Spectroscopy and Atomic Relaxations;65
6.5;3.5 Single Atom Chemical Identification;70
6.6;3.6 Force Spectroscopy with Higher Flexural Modes;78
6.7;3.7 Summary;82
6.7.1;Acknowledgments;82
6.8;References;83
7;4 Tip–Sample Interactions as a Function of Distance on Insulating Surfaces;86
7.1;4.1 Experimental Evaluation of Short-range Forces;87
7.1.1;4.1.1 Measurement Techniques;87
7.1.2;4.1.2 Conversion of Frequency Shift to Force;89
7.1.3;4.1.3 Separation of Short-range and Long-range Forces;90
7.2;4.2 Short-range Forces on Insulating Surfaces;93
7.2.1;4.2.1 Simple Model for Electrostatic Forces;93
7.2.2;4.2.2 Relaxation and Realistic Electrostatic Interactions;95
7.2.3;4.2.3 Interaction of a Tip with a Well-known Surface;97
7.2.4;4.2.4 Sublattice Identification on Alkali Halide Surfaces;99
7.2.5;4.2.5 Full Three-Dimensional Force Field;100
7.2.6;4.2.6 Atomic Jumps and Energy Dissipation;103
7.2.6.1;Acknowledgement;109
7.3;References;109
8;5 Force Field Spectroscopy in Three Dimensions;112
8.1;5.1 Introduction;112
8.2;5.2 Three-Dimensional Force FieldSpectroscopy: The Technique;114
8.2.1;5.2.1 Experimental Set-up;114
8.2.2;5.2.2 The Interrelation Between Frequency Shiftand Tip–Sample Forces;117
8.2.3;5.2.3 Extending Dynamic Force Spectroscopyto Three Dimensions;119
8.3;5.3 Force Field Spectroscopy on Ionic Crystals;121
8.3.1;5.3.1 Force Fields and Energy Dissipation on NaCl ;121
8.3.2;5.3.2 Force Vector Fields on KBr ;127
8.4;5.4 True 3D Force Field Spectroscopy on Graphite ;130
8.4.1;Acknowledgements;133
8.5;References;134
9;6 Principles and Applications of the qPlus Sensor;137
9.1;6.1 Motivation: qPlus Versus Si Cantilever;137
9.1.1;6.1.1 Specifications of an Atomic Force Probe;138
9.1.2;6.1.2 Cantilevers in Dynamic Force Microscopy;140
9.1.3;6.1.3 Advantages of Small Amplitude Operation;141
9.1.4;6.1.4 Ideal Physical Properties of Cantilevers;144
9.2;6.2 Theory of qPlus Versus Tuning Fork Sensors;144
9.2.1;6.2.1 Quartz Tuning Forks;144
9.2.2;6.2.2 qPlus Sensor ;147
9.2.3;6.2.3 Manufacturing High Quality qPlus Sensors ;148
9.2.4;6.2.4 Preamplifiers for qPlus Sensors ;150
9.3;6.3 Applications;153
9.3.1;6.3.1 Own Results;153
9.3.2;6.3.2 External Groups;154
9.4;6.4 Outlook;154
9.4.1;Acknowledgment;156
9.5;References;156
10;7 Study of Thin Oxide Films with NC-AFM:Atomically Resolved Imaging and Beyond;159
10.1;7.1 Introduction;159
10.2;7.2 Methods and Experimental Setup;161
10.2.1;7.2.1 Quartz Tuning Fork-based Sensor for Dual-Mode NC-AFM/STM ;161
10.2.2;7.2.2 Concepts for Force and Energy Extraction and Sensor Characterization;164
10.3;7.3 Atomic Resolution Imaging;166
10.4;7.4 Beyond Imaging: Spectroscopy;172
10.4.1;7.4.1 z-Spectroscopy on Specific Atomic Sites;173
10.4.2;7.4.2 Work Function Shift Measurements;176
10.5;7.5 Conclusion;181
10.5.1;Acknowledgements;181
10.6;References;181
11;8 Atom Manipulation on Semiconductor Surfaces;184
11.1;8.1 Introduction;184
11.2;8.2 Experimental;186
11.3;8.3 Vertical Atom Manipulation;187
11.4;8.4 Lateral Atom Manipulation at Low Temperature;188
11.5;8.5 Interchange Lateral Atom Manipulation ;190
11.6;8.6 Lateral Atom Manipulation at Room Temperature;194
11.7;8.7 Interchange Vertical Atom Manipulation ;199
11.8;8.8 Summary;203
11.8.1;Acknowledgement;203
11.9;References;204
12;9 Atomic Manipulation on Metal Surfaces;206
12.1;9.1 Introduction;207
12.2;9.2 Modes of Manipulation;208
12.3;9.3 Instrumentation;210
12.3.1;9.3.1 Detected Signals;212
12.4;9.4 Forces During Adsorbate Manipulating;214
12.4.1;9.4.1 Manipulating a Small Molecule: CO on Cu(111);221
12.5;9.5 Modeling Forces and Conductance;222
12.6;9.6 Mapping the Energy Landscape;224
12.7;9.7 Summary;228
12.7.1;Acknowledgments;228
12.8;References;228
13;10 Atomic Manipulation on an Insulator Surface;231
13.1;10.1 Introduction;232
13.2;10.2 Basic Principles;232
13.2.1;10.2.1 Experimental Procedures;232
13.2.2;10.2.2 Surface Characterization;233
13.3;10.3 Experimental Results;235
13.3.1;10.3.1 Defect Preparation and Contrast Formation;235
13.3.2;10.3.2 Manipulation of Mobile Defects;237
13.3.3;10.3.3 Velocity Dependence of Manipulation;239
13.4;10.4 Conclusions;239
13.4.1;Acknowledgments;240
13.5;References;240
14;11 Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM;241
14.1;11.1 Introduction;241
14.2;11.2 Theoretical Approach: First-PrinciplesSimulations ;243
14.3;11.3 The Short Range Chemical Interaction Between Tip and Sample;244
14.4;11.4 Manipulation in the Attractive Regime: Vacanciesin the Si(111)-(77) Reconstruction;246
14.5;11.5 Manipulation in the Repulsive Tip–Surface Interaction Regime;251
14.5.1;11.5.1 A Complex Phase Space Under Strong Tip–Surface Interactions;251
14.5.2;11.5.2 Dip-Pen Atomic Lithography: Vertical AtomInterchange Between the Tip and the Surfacein the -Sn/Si(111)-(33) Surface;254
14.6;11.6 Conclusion;261
14.6.1;Acknowledgements;262
14.7;References;262
15;12 Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces;264
15.1;12.1 Introduction;264
15.2;12.2 Methods;266
15.2.1;12.2.1 Modelling the Instrument;266
15.2.2;12.2.2 Modelling the Tip–Surface Junction;267
15.2.3;12.2.3 Kinetic Monte Carlo;269
15.3;12.3 Applications;271
15.3.1;12.3.1 Pd Adatom on MgO (001);271
15.3.2;12.3.2 H2O Adsorbate on CeO2 (111);276
15.3.3;12.3.3 C60 on Si (001);278
15.4;12.4 Discussion;283
15.4.1;Acknowledgements;284
15.5;References;285
16;13 Magnetic Exchange Force Microscopy;287
16.1;13.1 Introduction;287
16.2;13.2 Tip Preparation;289
16.3;13.3 NiO(001);290
16.4;13.4 Fe/W(001);294
16.5;13.5 Future Perspectives;297
16.6;References;297
17;14 First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001);299
17.1;14.1 Introduction;299
17.2;14.2 Computational Method;301
17.3;14.3 Analysis of the Magnetic Exchange Forces;303
17.3.1;14.3.1 Unrelaxed Tip and Sample;303
17.3.2;14.3.2 Influence of Structural Relaxations;305
17.3.3;14.3.3 Electronic and Magnetic Structure Changesdue to Tip–Sample Interaction;306
17.3.4;14.3.4 Influence of Tip Size;307
17.4;14.4 Simulation of MExFM Images;309
17.5;14.5 Summary;311
17.6;References;312
18;15 Frequency Modulation Atomic Force Microscopy in Liquids;314
18.1;15.1 Brief Overview;314
18.2;15.2 Problems of Frequency Modulation AFMin Liquids;315
18.2.1;15.2.1 Viscous Damping of Cantilever in Fluid;315
18.2.2;15.2.2 Electric Double Layer Force ;318
18.3;15.3 Frequency Noise in Frequency ModulationAtomic Force Microscopy ;319
18.3.1;15.3.1 Basics of Frequency Modulation;319
18.3.2;15.3.2 Frequency Noise Analysis in High-Q Environment;321
18.3.3;15.3.3 Frequency Noise Analysis in Low-Q Environment;325
18.4;15.4 Improvement of FM-AFM for Liquid Environment;327
18.4.1;15.4.1 Optimization of Optical Beam Deflection Sensor;327
18.4.2;15.4.2 Reduction of Coherence Length of Laser;329
18.4.3;15.4.3 Reduction of Oscillation Amplitude;331
18.5;15.5 High-Resolution Imaging by FM-AFM in Liquid;332
18.5.1;15.5.1 Muscovite Mica ;332
18.5.2;15.5.2 Purple Membrane Proteins ;334
18.5.3;15.5.3 Isolated Protein Molecules ;334
18.5.4;15.5.4 Measurement of Local Hydration Strcutres ;336
18.6;15.6 Summary and Outlook;337
18.7;References;338
19;16 Biological Applications of FM-AFM in Liquid Environment;340
19.1;16.1 Quantitative Force Measurements;340
19.1.1;16.1.1 Calculating Force from Frequency Shift;340
19.1.2;16.1.2 Cantilever Excitation in Liquid;341
19.1.3;16.1.3 Single Molecule Spectroscopy;343
19.2;16.2 Subnanometer-Resolution Imaging;344
19.2.1;16.2.1 Overview;344
19.2.2;16.2.2 Technical Progresses;347
19.2.3;16.2.3 Biological Applications;349
19.2.3.1;Hydration Layers;349
19.2.3.2;Lipid-Ion Network;350
19.2.3.3;Amyloid Fibrils;353
19.3;16.3 Future Prospects;354
19.4;References;355
20;17 High-Frequency Low Amplitude Atomic Force Microscopy;357
20.1;17.1 Cantilever;357
20.2;17.2 Cantilever Vibration Excitation;358
20.3;17.3 Cantilever Vibration Detection;361
20.4;17.4 AFM Head;362
20.5;17.5 Control Scheme;364
20.6;17.6 Imaging with Small Amplitude of Drive;365
20.7;17.7 Lateral Dynamic Force Microscopy;366
20.8;17.8 Summary;368
20.9;References;369
21;18 Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy;371
21.1;18.1 Introduction;371
21.2;18.2 Eigenmodes of AFM Cantilevers;373
21.2.1;18.2.1 Eigenmodes of Tipless Microcantilevers;373
21.2.2;18.2.2 Influence of Tip Mass on AFM Cantilever Eigenmodes;375
21.2.3;18.2.3 Eigenmodes of Triangular AFM Microcantilevers;376
21.3;18.3 Cantilever Dynamics in AM-AFM ;378
21.3.1;18.3.1 Mathematical Simulations of Cantilever Dynamics;378
21.3.2;18.3.2 Single Mode Nonlinear Phenomena in dAFM:Bifurcations, Higher Harmonics, and Chaos;380
21.3.3;18.3.3 Multimode Nonlinear Dynamics in dAFM;385
21.3.4;18.3.4 Cantilever Dynamics in Liquids;386
21.4;18.4 Cantilever Dynamics in FM-AFM;389
21.4.1;18.4.1 Origins of Frequency Shift and Its Measurement;390
21.4.2;18.4.2 Selecting Probes for FM-AFM;393
21.4.3;18.4.3 Dynamic Characteristics of High FrequencyCantilevers and Tuning Forks;395
21.4.4;18.4.4 Higher Harmonics in FM-AFM;398
21.4.5;18.4.5 FM-AFM Under Liquids;399
21.5;18.5 Outlook;399
21.6;References;401
22;Index;406