Osten / Kujawinska Fringe 2009

6th International Workshop on Advanced Optical Metrology
1. Auflage 2010
ISBN: 978-3-642-03051-2
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 792 Seiten

21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.

Autoren/Hrsg.

Osten, Wolfgang

Kujawinska, Malgorzata

Inhaltsverzeichnis

1;Conference Committee;6
2;Preface;8
3;Table of Contents;10
4;Holography in the '60s and '70s – A View from the Fringes;25
5;Coherence Holography: A Thought on Synthesis and Analysis of Optical Coherence Fields;36
6;The Polarization Approach in Measuring Correlation Properties of Optical Fields;44
7;Real-time Coherence Holography;50
8;Coherence and Correlation in Digital Holography;56
9;Analysis of fringe formation and localization in optical interferometry using optical coherence;63
10;Quantitative Phase Imaging in Microscopy;72
11;Comparison and unification of speckle-based phase retrieval and holography with applications in phasefront alignment and recognition;79
12;High Precision Object Phase Reconstruction with Modified Phase Retrieval;85
13;Phase retrieval with an LCoS display: characterization and application;94
14;Digital dynamic-fringe pattern processing without frequency carrier, using wideband phase- shifting algorithms.;100
15;Error-compensating phase-shifting Fizeau interferometry with a wavelength- tunable laser diode;109
16;Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane;115
17;Digital phase shifting holography and holographic interferometry;121
18;Fourier-transform method with high accuracy by use of iterative technique narrowing the spectra of a fringe pattern;128
19;Fringe pattern processing using a new adaptive and steereable asynchronous algorithm;134
20;Synthetic Aperture Digital Holography;140
21;A new application of the Delaunay triangulation: The processing of speckle interferometry signals;145
22;Phase analysis of interference signal with optical Hilbert transform based on orthogonal linear polarization phase shifting;154
23;Digital Fourier-transform processing for analysis of speckle photographs;160
24;Wavefront evaluation in phase shifting interferometry based on recurrence fringe processing with 3D prediction;164
25;White-light fringe analysis with low-cost CCD camera;171
26;Design and assessment of Differential Phase- Shifting Algorithms by means of their Fourier representation;175
27;A Nonlinear Technique for Automatic Twin-Image and Zero- Order Term Suppression in Digital Holographic Microscopy;182
28;Modified two-step phase-shifting algorithm: analysis, demonstration, and application;186
29;The Used of Reference Wave for Diagnostics of Phase Singularities;192
30;New convolution algorithms for reconstructing extended objects encoded in digitally recorded holograms;196
31;Reconstruction of noisy measured sharp edges at thin sheet metal components;202
32;Reduction of speckles in digital holographic interferometry;206
33;Normalization and denoising in a multi-source and multi- camera profilometric system;211
34;Automated Phase Map Referencing Against Historic Phase Map Data;215
35;Numerical multiplexing and de-multiplexing techniques for efficient storage and transmission of digital holographic information;219
36;Fringe Pattern Normalization Using Bidimensional Empirical Mode Decomposition and the Hilbert Transform;223
37;Complementary Filtering Approach to Enhance the Optical Reconstruction of Holograms from a Spatial Light Modulator;227
38;Combination of Phase Stepping and Fringe Tracking to Evaluate Strain from Noisy DSPI Data;233
39;Influence of filter operators on 3D coordinate calculation in fringe projection systems;237
40;Polarization interferometry of singular structure of organic crystal polarization properties.;243
41;Zero order interferometry technique for measuring the Lyapunov’s maximal index in optical fields;247
42;Orientation-selective spiral-phase contrast microscopy;252
43;Model-based white light interference microscopy for metrology of transparent film stacks and optically- unresolved structures;257
44;Limitations and Optimization of Low-coherence Interferometry for High Precision Microscopic Form Measurement;265
45;Instantaneous Wavelength Detection by a Whole- Field k- space Method;271
46;Limiting aspects in length measurements by interferometry;277
47;Aspects of design and the characterization of a high resolution heterodyne displacement interferometer;284
48;The femtosecond optical synthesizer as a tool for determination of the refractive index of air in ultra- precise measurement of lengths;290
49;Digital holographic microscopy with a simultaneous phase- shifting interferometer for measuring the angular spectrum generated by micro- optical structures;296
50;Resolution enhancement in digital holography by a two- dimensional electro- optically tunable phase grating;304
51;Resolution improvement in lensless digital holographic interferometry;310
52;Digital holography catching up with analogue holography both in resolution and in field of view with a bottom- line camera;319
53;Fresnel and Fourier digital holography architectures: a comparison.;325
54;The last Word on Three-Flat Calibration – are we there yet?;330
55;A New Flatness Reference Measurement System Based on Deflectometry and Difference Deflectometry;339
56;Quasi absolute Test for Aspherics via dual Wavefront Holograms and a radial Shear Position;345
57;Rapid and flexible measurement of precision aspheres;351
58;Measurement of the shape of objects by the interferometry with two wavelengths;360
59;Recording-plane division multiplexing (RDM) in pulsed digital holography for optical metrology;366
60;Identification of deformation components in TV holography and digital holography;371
61;Extending the capabilities of the sphere interferometer of PTB by a stitching procedure;375
62;Fringe contrast improving in low coherence interferometry by white light emitting diodes spectrum shaping;379
63;Absolute testing of aspherics in transmitted light using an amplitude DOE;385
64;MEMS Calibration Standards for the Optical Measurement of Displacements;390
65;About the feasibility of nearfield-farfield transformers based on optical metamaterials;396
66;Analogy of white-light interferometry and pulse shaping;405
67;Nanomeasuring and Nanopositioning Engineering;410
68;Reconstruction of Shape using Gradient Measuring Optical Systems;418
69;Metrological SPM with positioning controlled by green light interferometry;425
70;Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy;431
71;Deflectometry: 3D-Metrology from Nanometer to Meter;436
72;3-D Sensing for Microstructures Using Dynamic DOEs;442
73;Doppler phase-shift fringe analysis and digital holography using high- speed digital camera;448
74;Shape and Deformation Measurement of Moving Object by Sampling Moiré Method;453
75;New Interferometry Tools for AeroOptics;459
76;Dynamic Fizeau Interferometers;465
77;Surface contouring of vibrating objects using quadrature transform;475
78;Development and Application of a 10 Hz Nd:YAG Double Pulse Laser for Vibration Measurements with Double Pulse ESPI;481
79;Combining novel fringe analysis and photogrammetry for industrial shape measurement;487
80;Digital holographic interferometry for deformation measurement by means of an acoustical device;492
81;Pump-probe interference microscope observation for femtosecond- laser induced phenomena;497
82;Three-dimensional shape measurement of dynamic objects with spatially isolated surfaces;501
83;Optical design of a DOE-based laser interferometer for inspection of MEMS/MOEMS;505
84;Time Resolved High Resolution Shape and Colour Measurement using Fringe Projection;509
85;Dynamic 3-D shape measurement techniques with marked fringes tracking;513
86;Optical measurement and color map projection system to highlight geometrical features on free form surfaces;517
87;Digital holographic recording of large scale objects for metrology and display;521
88;Multiwavelength laser interferometry;525
89;Accurate and fast three-dimensional imaging with use of fringe projection profilometry;529
90;3D vibration analysis of granular materials with two- color digital Fresnel holography;533
91;System for transient spatio-temporal (4D) vibration imaging and non- destructive inspection;539
92;Microelements vibration measurement using quasi- heterodyning method and smart- pixel camera;543
93;Dynamic multipoint vibrometry using spatial light modulators;548
94;Optoelectronic method for device characterization and experimental validation of operational performance;553
95;Computational inverse holographic imaging: toward perfect reconstruction of wavefield distributions;561
96;Cooperative Sensor Approach for holistic geometrical Measurement Tasks on Cutting Tools;569
97;View Planning for 3D Reconstruction using Time-of- Flight Camera Data as a- priori Information;575
98;Stereo vision based approach for extracting features from digital holograms;581
99;Flexible Combination of Optical Metrology Strategies for the Automated Assembly of Solid State Lasers;587
100;A Numerical Simulation Benchmark of Tilt Scanning Interferometry for 3D Metrology;591
101;A virtual telecentric fringe projection system;595
102;Inspection of an extended surface by an active 3D multiresolution technique;599
103;Automated Multiscale Measurement System for micro optical elements;603
104;Simulation based sensitivity analysis and optimization of Scatterometry measurements for future semiconductor technology nodes;611
105;Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements;615
106;Novel interferometric measurement systems for the characterization of micro- optics;620
107;Design of a micro-optical low coherent interferometer array for the characterisation of MEMS and MOEMS;629
108;Looking for a new generation of MEMS-type confocal microscopes;636
109;Radial in-plane achromatic digital speckle pattern interferometer using an axis- symmetrical diffractive optical element;640
110;Wavefront Sensor Design based on a Micro- Mirror Array for a High Dynamic Range Measurement at a High Lateral Resolution;646
111;Intellectual property in industry and academia: where interests merge?;652
112;Moiré interferometer for surface mapping with liquid crystal grids;666
113;High resolution tilt scanning interferometry system for full sensitivity depth- resolved displacement measurements in weakly scattering materials;674
114;Multifunctional phase-stepping interferometer for measurement in real time;680
115;A Wonderful World of Holography, Interferometry, and Optical Testing;688
116;Multifunctional Encoding System for Assessment of Movable Cultural Heritage;698
117;Investigation of electronic PCB component with two- color digital holographic interferometry;706
118;Integrated Microinterferometric Sensor;711
119;High Precision Measurement of plane-parallel Parts;715
120;Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid;719
121;Near infrared large aperture (24 inches) interferometer system development;723
122;Interior Geometry Inspection Using Rerouted Fringe Projection;727
123;A Cellular Force Microscopic System for Cell Mechanics Investigation;731
124;Candle flame analysis by digital three-wavelength holographic interferometry;735
125;Moiré fringe generation and phase shifting using a consumer product LCD projector;739
126;Speckle velocimetry for high accuracy and multi-dimensional odometry;744
127;Determination of Refractive Index Changes in Biconical Optical Fiber Taper;748
128;Prosthodontic crown mechanical integrity study using Speckle Interferometry;752
129;Monitoring of Drying Process of Paints using Lensless Fourier Transform Digital Holography;756
130;On the Digital Holographic Interferometry of Fibrous Materials: Opto- Mechanical Properties of Fibres;761
131;Geometrical camera calibration using lasers and diffractive optical elements;765
132;Measurement of the local displacement field produced by a microindentation using speckle interferometry. Its application to analyse coating adhesion;769
133;Space-Time Multiplexing in a Stereo-photogrammetry Setup;773
134;Interference Investigation of Concrete Structure and Dynamics During Hydration.;778
135;Off-axis Reconstruction Method for Displacement and Strain Distribution Measurement with Phase- Shifting Digital Holography;782
136;“Flying Triangulation”: A motion-robust optical 3D sensor principle;786
137;Laser direct writing of high resolution structures on curved substrates: evaluation of the writing precision;790
138;Scanning Holography – A tutorial;795