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E-Book

E-Book, Englisch, 428 Seiten

Reihe: Particle Acceleration and Detection

Strehl Beam Instrumentation and Diagnostics


2006
ISBN: 978-3-540-26404-0
Verlag: Springer Berlin Heidelberg
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 428 Seiten

Reihe: Particle Acceleration and Detection

ISBN: 978-3-540-26404-0
Verlag: Springer Berlin Heidelberg
Format: PDF
Kopierschutz: 1 - PDF Watermark



This book summarizes the experience of many years of teamwork with my group, the beam diagnostics group of GSI. For a long time the group was also responsible for operating the machines and application programming. In my opinion, this connection was very e?cient: ?rst, because a beam diagnostic system has to place powerful tools at the operators' disposal; second, because data evaluation and presentation of results for machine operation demand application programs which can be handled not only by skilled experts. On the other hand, accelerator developments and improvements as well as commissioning of new machines by specialists require more complex measu- ments than those for routine machine operation. A modern beam diagnostic system, including the software tools, has to cover these demands, too. Therefore, this book should motivate physicists, constructors, electronic engineers, and computer experts to work together during the design and daily use of a beam diagnostic system. This book aims to give them ideas and tools for their work. I would not have been able to write this book without a good education in physics and many discussions with competent leaders, mentors, and c- leagues. After working about 40 years in teams on accelerators, there are so many people I have to thank that it is impossible to mention them all by name here.

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Weitere Infos & Material


1;Preface;7
2;Commonly Used Abbreviations;10
3;Contents;12
4;1 Introduction;17
5;2 Beam Intensity Measurements;26
5.1;2.1 Faraday Cups;27
5.2;2.2 Calorimetric Intensity Measurements;47
5.3;2.3 Beam Current Transformers;48
5.4;2.4 The Cryogenic Current Comparator;67
5.5;2.5 Secondary Electron Monitors;70
5.6;2.6 Ionization Chambers;72
5.7;2.7 Particle Counting;74
5.8;Conclusion;85
6;3 Thermal Aspects;86
6.1;3.1 Relevant Formulas;86
6.2;3.2 DC-Beams;88
6.3;3.3 Intense Pulsed Beams;109
6.4;3.4 Cooling by Radiation;115
6.5;Conclusion;119
7;4 Beam Pro.le Measurements;120
7.1;4.1 Profile Grids, Harps;120
7.2;4.2 Pro.le Grids with Gas Ampli.cation (MWPC);129
7.3;4.3 Wire Scanners;130
7.4;4.4 Scintillation Screens;135
7.5;4.5 Residual Gas Ionization Monitors;138
7.6;4.6 Evaluation of Charge States and Mass Spectra from Beam Profile Measurements;159
7.7;4.7 Beam Alignment Based on Beam Profile Measurements;165
8;5 Measurements with Capacitive or Inductive Pickups;169
8.1;5.1 Principles of Signal Extraction;169
8.2;5.2 Capacitive Pickups, Basics;171
8.3;5.3 Examples of Application;193
8.4;5.4 Beam Position Monitors (BPM) in Circular Machines;208
8.5;Conclusion;225
9;6 Measurements in Phase Spaces;226
9.1;6.1 Transverse Phase Planes;227
9.2;6.2 Emittance Measurements in Transverse Phase Planes;228
9.3;6.3 Computer-Aided Optimization and Operation;283
9.4;6.A Dimensioning Motor Driven Feedthroughs;287
9.5;Conclusion;296
10;7 The Longitudinal Phase Plane;297
10.1;7.1 Emittance Measurements in the Longitudinal Phase Plane;298
10.2;Conclusion;311
11;8 The Electromagnetic Fields of Bunches;353
11.1;8.1 Introduction;353
11.2;8.2 Bunches with a Spherical Shape;354
11.3;8.3 Bunches with an Elliptical Shape;357
11.4;8.4 Comparison with a DC-Beam;360
11.5;8.5 Estimations of Space Charge E.ects;363
11.6;8.6 Special E.ects of Moving Charged Particles;374
11.7;8.A Solution of the Poisson Equation in the Elliptical Coordinate System;380
11.8;8.B Relativistic E.ects;385
12;9 Beam Loss Monitoring;388
12.1;9.1 Principles and Types of Beam Loss Monitors;389
13;10 Some Interesting Specialized Aspects of Beam Diagnostics;394
13.1;10.1 The Laserwire;394
13.2;10.2 The Fresnel Zone Plate Beam Pro.le Monitor;395
13.3;10.3 Beam Pro.le Monitor Based on a GEM Detector;395
13.4;10.4 High-Resolution Bunch Shape and Length Measurements;395
13.5;10.5 Electron Beam Scanner;396
13.6;10.6 AC Modulation of System Parameters;396
14;References;397
15;Index;415



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