Electronic Design Automation

Synthesis, Verification, and Test
Erscheinungsjahr 2009
ISBN: 978-0-12-374364-0
Verlag: Elsevier Science

Buch, Englisch, 800 Seiten, Format (B × H): 222 mm x 287 mm, Gewicht: 2841 g

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book.

Zielgruppe

Practitioners/Researchers in electronic design automation, including VLSI design engineers, verfication engineers, and test engineers.

Autoren/Hrsg.

Wang, Laung-Terng

Chang, Yao-Wen

Cheng

Cheng, Kwang-Ting (Tim)

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik

Inhaltsverzeichnis

Chapter 1: Introduction Chapter 2: Fundamentals of CMOS Design Chapter 3: Design for Testability Chapter 4: Fundamentals of Algorithms Chapter 5: Electronic System-Level Design and High-Level Synthesis Chapter 6: Logic Synthesis in a Nutshell Chapter 7: Test Synthesis Chapter 8: Logic and Circuit Simulation Chapter 9: Functional Verification Chapter 10: Floorplanning Chapter 11: Placement Chapter 12: Global and Detailed Routing Chapter 13: Synthesis of Clock and Power/Ground Networks Chapter 14: Fault Simulation and Test Generation.

Über Autor(innen)

Cheng, Kwang-Ting (Tim)
Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.

Wang, Laung-Terng
Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Chang, Yao-Wen
Yao-Wen Chang, Ph.D., is a Professor in the Department of Electrical Engineering, National Taiwan University. He recevied his Ph.D. degree in Computer Science from the University of Texas at Austin. He has published over 200 technical papers, co-authored one book, and is a winner of the ACM ISPD Placement (2006) and Global Routing (2008) contests.