Xie / Onal / Régnier Atomic Force Microscopy Based Nanorobotics

Modelling, Simulation, Setup Building and Experiments
Erscheinungsjahr 2011
ISBN: 978-3-642-20329-9
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 71, 344 Seiten, eBook

Reihe: Springer Tracts in Advanced Robotics

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Zielgruppe

Research

Autoren/Hrsg.

Xie, Hui

Onal, Cagdas

Régnier, Stéphane

Sitti, Metin

Inhaltsverzeichnis

Descriptions and challenges of AFM based nanorobotic systems.- Instrumentation issues of an AFM based nanorobotic system.- Nanomechanics of AFM based nanomanipulation.- Teleoperation based AFM manipulation control.- Automated control of AFM based nanomanipulation.- Applications of AFM based nanorobotic systems.