Advances in Imaging and Electron Physics

Erscheinungsjahr 2013
ISBN: 978-0-12-408142-0
Verlag: William Andrew Publishing

Buch, Englisch, 270 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 510 g

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie

Inhaltsverzeichnis

- Early History of Wien filters

Katsushige Tsuno and Damaschin Ioanoviciu

- Aberration Theory of Wien Filter

Damaschin Ioanoviciu and Katsushige Tsuno Wien Filter Instrumentation

Katsushige Tsuno and Damaschin Ioanoviciu

- Simulation of Multipole Wien Filters

Katsushige Tsuno and Damaschin Ioanoviciu

- Wien Filter Applications to Ions

Damaschin Ioanoviciu and Katsushige Tsuno

- Application of Wien filters to ElectronsKatsushige Tsuno and Damaschin Ioanoviciu

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.